Micron technology, inc. (20250014655). READ COUNTER ADJUSTMENT FOR DELAYING READ DISTURB SCANS
READ COUNTER ADJUSTMENT FOR DELAYING READ DISTURB SCANS
Organization Name
Inventor(s)
Nicola Ciocchini of Boise ID US
Animesh R. Chowdhury of Boise ID US
Kishore Kumar Muchherla of Fremont CA US
Jung Sheng Hoei of Newark CA US
Niccolo' Righetti of Boise ID US
Jonathan S. Parry of Boise ID US
READ COUNTER ADJUSTMENT FOR DELAYING READ DISTURB SCANS
This abstract first appeared for US patent application 20250014655 titled 'READ COUNTER ADJUSTMENT FOR DELAYING READ DISTURB SCANS
Original Abstract Submitted
methods, systems, and apparatuses include receiving a read command including a logical address. the read command is directed to a portion of memory composed of blocks and each block is composed of wordline groups. the physical address for the read command is identified using the logical address. the wordline group is determined using the physical address. a slope factor is retrieved using the wordline group. a read counter is incremented using the slope factor.