Micron technology, inc. (20250013382). QUICK CHARGE LOSS MITIGATION USING TWO-PASS CONTROLLED DELAY
QUICK CHARGE LOSS MITIGATION USING TWO-PASS CONTROLLED DELAY
Organization Name
Inventor(s)
Kishore Kumar Muchherla of Fremont CA US
Dung V. Nguyen of San Jose CA US
Dave Scott Ebsen of Minnetonka MN US
Tomoharu Tanaka of Yokohama JP
James Fitzpatrick of Laguna Niguel CA US
Huai-Yuan Tseng of San Ramon CA US
QUICK CHARGE LOSS MITIGATION USING TWO-PASS CONTROLLED DELAY
This abstract first appeared for US patent application 20250013382 titled 'QUICK CHARGE LOSS MITIGATION USING TWO-PASS CONTROLLED DELAY
Original Abstract Submitted
exemplary methods, apparatuses, and systems include a quick charge loss (qcl) mitigation manager for controlling writing data bits to a memory device. the qcl mitigation manager receives a first set of data bits for programming to memory. the qcl mitigation manager writes a first subset of data bits of the first set of data bits to a first memory block of the memory during a first pass of programming. the qcl mitigation manager writes a second subset of data bits of the first set of data bits to the first memory block during a second pass of programming in response to determining that the threshold delay is satisfied.
- Micron technology, inc.
- Kishore Kumar Muchherla of Fremont CA US
- Dung V. Nguyen of San Jose CA US
- Dave Scott Ebsen of Minnetonka MN US
- Tomoharu Tanaka of Yokohama JP
- James Fitzpatrick of Laguna Niguel CA US
- Huai-Yuan Tseng of San Ramon CA US
- Akira Goda of Tokyo JP
- Eric N. Lee of San Jose CA US
- G06F3/06
- CPC G06F3/0655