Micron technology, inc. (20250004663). TEMPERATURE-BASED READ DISTURB OPERATIONS
TEMPERATURE-BASED READ DISTURB OPERATIONS
Organization Name
Inventor(s)
Christina Papagianni of San Jose CA US
Zhenming Zhou of San Jose CA US
TEMPERATURE-BASED READ DISTURB OPERATIONS
This abstract first appeared for US patent application 20250004663 titled 'TEMPERATURE-BASED READ DISTURB OPERATIONS
Original Abstract Submitted
aspects of the present disclosure configure a system component, such as a memory sub-system controller, to provide adaptive media management based on temperature-related memory component capabilities. the controller determines a read disturb condition criterion associated with an individual memory component of a set of memory components and determines a temperature of a memory sub-system comprising the set of memory components. the controller adjusts the read disturb condition criterion based on the temperature and program erase cycles (pec) of the memory sub-system and performs an individual media management operation on the individual memory component in response to determining that the adjusted read disturb condition criterion has been satisfied.