Micron Technology, Inc. (20250086058). READ CALIBRATION BY SECTOR OF MEMORY
READ CALIBRATION BY SECTOR OF MEMORY
Organization Name
Inventor(s)
Priya Venkataraman of Boise ID (US)
Pitamber Shukla of Boise ID (US)
Vipul Patel of Santa Clara CA (US)
Scott A. Stoller of Boise ID (US)
READ CALIBRATION BY SECTOR OF MEMORY
This abstract first appeared for US patent application 20250086058 titled 'READ CALIBRATION BY SECTOR OF MEMORY
Original Abstract Submitted
read calibration by sector of memory can include reading a page of memory, having more than one sector, with a read level, such as a default read level. in response to an error, such as an uncorrectable error correction code read result, the respective read level can be calibrated for each sector to yield a respective calibrated read level per sector. the page of memory can be read with the respective calibrated read level per sector. the calibrated read levels can be stored.
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