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Category:G01N23/2251
Subcategories
This category has the following 8 subcategories, out of 8 total.
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Pages in category "G01N23/2251"
The following 22 pages are in this category, out of 22 total.
1
- 18195190. DEFECT DETECTION DEVICE AND METHOD THEREOF simplified abstract (Samsung Electronics Co., Ltd.)
- 18219494. SUBSTRATE INSPECTION METHOD simplified abstract (Samsung Electronics Co., Ltd.)
- 18243835. PATTERN INSPECTION APPARATUS AND PATTERN INSPECTION METHOD USING THE SAME simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 18458565. WAFER MEASUREMENT APPARATUS AND OPERATING METHOD THEREOF simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 18569860. Inspection Device and Inspection Method simplified abstract (HITACHI HIGH-TECH CORPORATION)
- 18625788. SEMICONDUCTOR STRUCTURE INSPECTION USING A HIGH ATOMIC NUMBER MATERIAL simplified abstract (Taiwan Semiconductor Manufacturing Company, Ltd.)
- 18744264. DETERMINING ASPECT RATIO DEPENDENT PORE SIZE DISTRIBUTIONS FOR MULTIPLE PORE TYPES AND PROCESSES FOR USING SAME (Schlumberger Technology Corporation)
- 18834131. FIELD OF VIEW SELECTION FOR METROLOGY ASSOCIATED WITH SEMICONDUCTOR MANUFACTURING (ASML Netherlands B.V.)
- 18835838. Ion Milling Device, and Inspection System (HITACHI HIGH-TECH CORPORATION)
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- Samsung electronics co., ltd. (20240127425). DEFECT DETECTION DEVICE AND METHOD THEREOF simplified abstract
- Samsung electronics co., ltd. (20240192154). PATTERN INSPECTION APPARATUS AND PATTERN INSPECTION METHOD USING THE SAME simplified abstract
- Samsung electronics co., ltd. (20240248051). WAFER MEASUREMENT APPARATUS AND OPERATING METHOD THEREOF simplified abstract
- Samsung Electronics Co., Ltd. patent applications on April 18th, 2024
- Samsung Electronics Co., Ltd. patent applications on January 18th, 2024
- Samsung Electronics Co., Ltd. patent applications on July 25th, 2024
- SAMSUNG ELECTRONICS CO., LTD. patent applications on July 25th, 2024
- Samsung Electronics Co., Ltd. patent applications on June 13th, 2024
- SAMSUNG ELECTRONICS CO., LTD. patent applications on June 13th, 2024
- Schlumberger technology corporation (20240418623). DETERMINING ASPECT RATIO DEPENDENT PORE SIZE DISTRIBUTIONS FOR MULTIPLE PORE TYPES AND PROCESSES FOR USING SAME
- Schlumberger Technology Corporation patent applications on December 19th, 2024