Category:G01N21/3504
Spectroscopic Analysis in the G01N21/3504 IPC Class
The International Patent Classification (IPC) code G01N21/3504 relates to the spectroscopic analysis of materials, specifically focusing on techniques and apparatuses for investigating or analyzing materials by the use of optical means. This niche within spectroscopy involves examining the interaction between light and matter to determine various properties of substances, a critical aspect of material science, chemistry, and engineering.
Overview of G01N21/3504
The G01N21/3504 classification falls under the broader category of G01N, which pertains to investigating or analyzing materials by determining their chemical or physical properties. More specifically, the '/3504' subclassification is dedicated to methods that utilize diffraction of light, including X-rays, neutrons, and electron beam diffraction techniques, to elucidate the structure, composition, and properties of materials. These methods are pivotal in areas such as material research, quality control, and the development of new materials.
Innovations and Applications
Several lesser-known companies are at the forefront of innovations in the G01N21/3504 field, developing cutting-edge spectroscopic analysis technologies. These enterprises are pushing the boundaries of what's possible in material characterization, offering more precise, faster, and more cost-effective solutions than ever before.
One such company, SpectraAnalysis Inc. (link to their website), specializes in advanced diffraction-based analytical instruments. Their proprietary technology has applications ranging from pharmaceutical quality control to the analysis of complex materials in research laboratories.
Relevant IPC Classifications
Spectroscopic analysis in the G01N21/3504 category often overlaps with other IPC codes, such as:
- G01N21/00 - Optical analysis techniques
- G01N23/00 - Investigating materials by using wave or particle radiation
These classifications represent a family of technologies that share common principles but are differentiated by their specific applications and methodologies.
Categories
Questions about Spectroscopic Analysis in G01N21/3504
What is the significance of diffraction techniques in material analysis?
Diffraction techniques, which are central to the G01N21/3504 classification, allow for the detailed study of the atomic and molecular structure of materials. This information is crucial for understanding material properties, developing new materials, and improving existing ones.
How do innovations in G01N21/3504 contribute to industry advancements?
Innovations within this IPC class can lead to significant advancements in various industries by enabling more efficient material characterization. This, in turn, can lead to the development of stronger, lighter, and more durable materials for applications ranging from aerospace to consumer electronics.
What are some challenges faced in the spectroscopic analysis field?
Challenges include the need for high precision and accuracy, the complexity of analyzing novel materials, and the constant push for faster analysis times without sacrificing quality.
How does G01N21/3504 intersect with environmental research?
This classification plays a vital role in environmental research by enabling the analysis of pollutants and the development of materials for environmental remediation.
What future trends are expected in the field of G01N21/3504?
Future trends include the integration of AI and machine learning for data analysis, the development of portable and in-field analysis devices, and the continual push towards non-destructive testing methods.
Subcategories
This category has the following 4 subcategories, out of 4 total.
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Pages in category "G01N21/3504"
The following 35 pages are in this category, out of 35 total.
1
- 18134997. SYSTEM AND METHOD OF MONITORING PRECURSOR TANK simplified abstract (TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.)
- 18579600. TERAHERTZ DETECTION DEVICE simplified abstract (SONY SEMICONDUCTOR SOLUTIONS CORPORATION)
- 18602024. OPTICAL MEMBER AND GAS SENSOR simplified abstract (Asahi Kasei Microdevices Corporation)
- 18612104. Spectroscopic Device and Shape Measurement Device simplified abstract (SEIKO EPSON CORPORATION)
- 18679941. SEMICONDUCTOR WAFER, SEMICONDUCTOR DEVICE, AND GAS CONCENTRATION MEASURING DEVICE simplified abstract (Asahi Kasei Microdevices Corporation)
- 18882459. METHODS, APPARATUSES, AND SYSTEMS FOR DIAGNOSING MISALIGNMENT IN GAS DETECTING DEVICES (HONEYWELL INTERNATIONAL INC.)
- 18909623. THERMAL EMITTER, METHOD FOR OPERATING A THERMAL EMITTER AND MEMS GAS/FLUID SENSOR (Infineon Technologies AG)
2
- 20240035961. LASER IMAGING OF GASES FOR CONCENTRATION AND LOCATION IDENTIFICATION simplified abstract (Ohio State Innovation Foundation)
- 20240044783. GENERATING HIGH-RESOLUTION CONCENTRATION MAPS FOR ATMOSPHERIC GASES USING GEOGRAPHY-INFORMED MACHINE LEARNING simplified abstract (Palo Alto Research Center Incorporated)
A
- AgTech patent applications on 10th Jan 2025
- AgTech patent applications on August 15th, 2024
- AgTech patent applications on February 1st, 2024
- AgTech patent applications on February 8th, 2024
- AgTech patent applications on January 9th, 2025
- Applied Materials, Inc. patent applications on February 6th, 2025
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- Omni Medsci, Inc. (20240225454). CAMERA BASED SYSTEM WITH PROCESSING USING ARTIFICIAL INTELLIGENCE FOR DETECTING ANOMALOUS OCCURRENCES AND IMPROVING PERFORMANCE simplified abstract
- Omni Medsci, Inc. (20240268680). TIME-OF-FLIGHT SENSORS CO-REGISTERED WITH CAMERA SYSTEMS simplified abstract
- Omni Medsci, Inc. (20250009232). TIME-OF-FLIGHT MEASUREMENT ON USER WITH CAMERAS AND POSITION SENSOR
- Omni Medsci, Inc. (20250009233). REMOTE SENSING SYSTEM WITH TIME-OF-FLIGHT SENSOR, ACTIVE ILLUMINATOR AND LIGHT SENSING SYSTEM