18895236. READ COUNTER ADJUSTMENT FOR DELAYING READ DISTURB SCANS (Micron Technology, Inc.)

READ COUNTER ADJUSTMENT FOR DELAYING READ DISTURB SCANS

Organization Name

Micron Technology, Inc.

Inventor(s)

Nicola Ciocchini of Boise ID (US)

Animesh R. Chowdhury of Boise ID (US)

Kishore Kumar Muchherla of Fremont CA (US)

Akira Goda of Tokyo (JP)

Jung Sheng Hoei of Newark CA (US)

Niccolo' Righetti of Boise ID (US)

Jonathan S. Parry of Boise ID (US)

READ COUNTER ADJUSTMENT FOR DELAYING READ DISTURB SCANS

This abstract first appeared for US patent application 18895236 titled 'READ COUNTER ADJUSTMENT FOR DELAYING READ DISTURB SCANS

Original Abstract Submitted

Methods, systems, and apparatuses include receiving a read command including a logical address. The read command is directed to a portion of memory composed of blocks and each block is composed of wordline groups. The physical address for the read command is identified using the logical address. The wordline group is determined using the physical address. A slope factor is retrieved using the wordline group. A read counter is incremented using the slope factor.