LEAKAGE REDUCTION FOR CONTINUOUS ACTIVE DESIGNS

Organization Name

INTERNATIONAL BUSINESS MACHINES CORPORATION

Inventor(s)

Jason J Stuffle of Burlington VT (US)

Albert M. Chu of Nashua NH (US)

Charles Nicholas Perez of Burlington VT (US)

LEAKAGE REDUCTION FOR CONTINUOUS ACTIVE DESIGNS

This abstract first appeared for US patent application 18336683 titled 'LEAKAGE REDUCTION FOR CONTINUOUS ACTIVE DESIGNS

Original Abstract Submitted

A device comprises memory configured to store program instructions, and processing circuitry, coupled to the memory, and configured to execute the program instructions to perform a process to limit current leakage. The processing circuitry is configured to receive an input of an initial layout of a semiconductor structure comprising a plurality of cells, identify a plurality of edge source/drain regions in respective ones of the cells, determine respective electrical configurations for the edge source/drain regions, compute respective values associated with current leakage for adjacent cells in the initial layout and in a plurality of alternative layouts of the semiconductor structure based at least in part on the respective electrical configurations for the edge source/drain regions, and identify at least one alternative layout of the plurality of alternative layouts to the initial layout that results in at least a reduction of total current leakage from the initial layout.