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Category:G01R31/319
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Pages in category "G01R31/319"
The following 15 pages are in this category, out of 15 total.
1
- 17550157. INTEGRATED CIRCUIT CHIP HAVING BACK-SURFACE TOPOGRAPHY FOR ENHANCED COOLING DURING CHIP TESTING simplified abstract (INTERNATIONAL BUSINESS MACHINES CORPORATION)
- 17944691. MEMORY REPAIR SYSTEM AND METHOD simplified abstract (QUALCOMM Incorporated)
- 18105792. SYSTEMS AND METHODS OF TESTING DEVICES USING CXL FOR INCREASED PARALLELISM simplified abstract (ADVANTEST CORPORATION)
- 18299265. WAFER-LEVEL MULTI-DEVICE TESTER AND SYSTEM INCLUDING THE SAME simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)