20240085478.WAFER-LEVEL MULTI-DEVICE TESTER AND SYSTEM INCLUDING THE SAME simplified abstract (samsung electronics co., ltd.)
Contents
- 1 WAFER-LEVEL MULTI-DEVICE TESTER AND SYSTEM INCLUDING THE SAME
- 1.1 Organization Name
- 1.2 Inventor(s)
- 1.3 WAFER-LEVEL MULTI-DEVICE TESTER AND SYSTEM INCLUDING THE SAME - A simplified explanation of the abstract
- 1.4 Simplified Explanation
- 1.5 Potential Applications
- 1.6 Problems Solved
- 1.7 Benefits
- 1.8 Potential Commercial Applications
- 1.9 Possible Prior Art
- 1.10 Original Abstract Submitted
WAFER-LEVEL MULTI-DEVICE TESTER AND SYSTEM INCLUDING THE SAME
Organization Name
Inventor(s)
Seongkwan Lee of Suwon-si (KR)
WAFER-LEVEL MULTI-DEVICE TESTER AND SYSTEM INCLUDING THE SAME - A simplified explanation of the abstract
This abstract first appeared for US patent application 20240085478 titled 'WAFER-LEVEL MULTI-DEVICE TESTER AND SYSTEM INCLUDING THE SAME
Simplified Explanation
The abstract describes a tester for analyzing signals generated by devices under test (DUTs), with signal analysis circuits and signal processing units connected by a switch array.
- The tester is designed to analyze signals from multiple DUTs using signal analysis circuits.
- A switch array connects the signal analysis circuits to signal processing units for further analysis.
- The number of signal processing units can be fewer than the maximum number of DUTs connected to the tester.
- The configuration allows for efficient signal analysis and processing during testing.
Potential Applications
The technology can be used in various industries such as electronics manufacturing, telecommunications, and automotive for testing and analyzing signals from multiple devices simultaneously.
Problems Solved
1. Efficient signal analysis: The tester allows for the analysis of signals from multiple DUTs without the need for a one-to-one connection between each DUT and a signal processing unit. 2. Space-saving: By having fewer signal processing units than the maximum number of DUTs, the tester saves space and reduces costs.
Benefits
1. Cost-effective testing solution for analyzing signals from multiple devices. 2. Streamlined signal analysis process for improved efficiency. 3. Space-saving design for compact testing setups.
Potential Commercial Applications
Optimizing signal analysis processes in industries such as semiconductor manufacturing, telecommunications equipment testing, and automotive electronics testing.
Possible Prior Art
One possible prior art could be testers with a one-to-one connection between each DUT and a signal processing unit, which may not be as efficient or cost-effective as the described technology.
Unanswered Questions
How does the switch array handle the routing of signals from the signal analysis circuits to the signal processing units efficiently?
The switch array is not described in detail in the abstract. Further information on its design and operation would provide insights into the efficiency of signal routing in the tester.
What types of signals can the signal analysis circuits and signal processing units handle?
The abstract does not specify the range or types of signals that the circuits and units can analyze. Understanding the capabilities of the tester in terms of signal types would be beneficial for potential users.
Original Abstract Submitted
a tester, which is adapted to test a device under test (dut), includes a first plurality of signal analysis circuits configured to analyze signals generated by a plurality of duts, and a second plurality of signal processing units configured to process the signals analyzed by the first plurality of signal analysis circuits. a switch array is provided, which is electrically coupled between the first plurality of signal analysis circuits and the second plurality of signal processing units. the switch array is configured to electrically connect selected ones of the first plurality of signal analysis circuits with corresponding ones of the second plurality of signal processing units. the number of signal processing units within the second plurality may be less than a maximum number of duts that can be connected to the first plurality of signal analysis circuits when the tester is testing a plurality of the duts.
