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Category:Dennis R. Smalley of Newhall CA (US)
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Pages in category "Dennis R. Smalley of Newhall CA (US)"
The following 6 pages are in this category, out of 6 total.
1
- 17401252. Probe Arrays and Improved Methods for Making and Using Longitudinal Deformation of Probe Preforms simplified abstract (Microfabrica Inc.)
- 17493802. Shielded Probes for Semiconductor Testing, Methods for Using, and Methods for Making simplified abstract (Microfabrica Inc.)
- 17507598. Probes with Planar Unbiased Spring Elements for Electronic Component Contact and Methods for Making Such Probes simplified abstract (Microfabrica Inc.)
- 17968552. Probes with Planar Unbiased Spring Elements for Electronic Component Contact, Methods for Making Such Probes, and Methods for Using Such Probes simplified abstract (Microfabrica Inc.)
- 17968601. Probes with Planar Unbiased Spring Elements for Electronic Component Contact, Methods for Making Such Probes, and Methods for Using Such Probes simplified abstract (Microfabrica Inc.)
- 17968638. Probes with Planar Unbiased Spring Elements for Electronic Component Contact, Methods for Making Such Probes, and Methods for Using Such Probes simplified abstract (Microfabrica Inc.)
