17493802. Shielded Probes for Semiconductor Testing, Methods for Using, and Methods for Making simplified abstract (Microfabrica Inc.)
Shielded Probes for Semiconductor Testing, Methods for Using, and Methods for Making
Organization Name
Inventor(s)
Arun S. Veeramani of Vista CA (US)
Stefano Felici of San Jose CA (US)
Dennis R. Smalley of Newhall CA (US)
Shielded Probes for Semiconductor Testing, Methods for Using, and Methods for Making - A simplified explanation of the abstract
This abstract first appeared for US patent application 17493802 titled 'Shielded Probes for Semiconductor Testing, Methods for Using, and Methods for Making
Simplified Explanation
The patent application describes dual shield probes with various features such as discontinuous dielectric spacers, fixed nodes, sliding nodes, shield nodes, bridges, stops, and interlocked dielectric and conductive elements.
- Discontinuous dielectric spacers
- Fixed nodes
- Sliding nodes
- Shield nodes
- Bridges
- Stops
- Interlocked dielectric and conductive elements
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- Potential Applications
The technology can be applied in the fields of electronics, telecommunications, and medical devices.
- Problems Solved
The dual shield probes address issues related to signal interference, signal loss, and signal distortion in electronic devices.
- Benefits
The probes offer improved signal quality, reduced interference, and enhanced performance in electronic systems.
- Potential Commercial Applications
The technology can be utilized in high-frequency testing equipment, medical imaging devices, and telecommunications infrastructure.
- Possible Prior Art
Prior art may include patents related to probe designs, signal transmission technologies, and electromagnetic shielding methods.
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- Unanswered Questions
- How does the dual shield probe compare to traditional single shield probes in terms of performance and reliability?
The article does not provide a direct comparison between dual shield probes and traditional single shield probes in terms of performance and reliability.
- Are there any limitations or drawbacks associated with the use of dual shield probes in certain applications?
The article does not discuss any potential limitations or drawbacks associated with the use of dual shield probes in specific applications.
Original Abstract Submitted
Dual shield probes are provided having one or more of a plurality of different features including: discontinuous dielectric spacers, fixed nodes, sliding nodes, shield nodes, bridges, stops, interlocked dielectric and conductive elements, along with methods of using and making such probes.
