US Patent Application 18446838. Systems and Methods for Classifying PUF Signature Modules of Integrated Circuits simplified abstract
Systems and Methods for Classifying PUF Signature Modules of Integrated Circuits
Organization Name
Taiwan Semiconductor Manufacturing Company Limited
Inventor(s)
Shih-Lien Linus Lu of Hsinchu (TW)
Systems and Methods for Classifying PUF Signature Modules of Integrated Circuits - A simplified explanation of the abstract
This abstract first appeared for US patent application 18446838 titled 'Systems and Methods for Classifying PUF Signature Modules of Integrated Circuits
Simplified Explanation
- The patent application describes a method for determining the reliability of a physically unclonable function (PUF) cell in a device. - The method involves providing activation signals to the PUF cell under different conditions and determining the output of the PUF cell for each condition. - The number of times the PUF cell output is consistent is then determined, indicating its reliability. - Based on the determined number of consistent outputs, a device classification value is determined for a plurality of PUF cells. - The innovation aims to provide a reliable and accurate assessment of the reliability of PUF cells in a device.
Original Abstract Submitted
Systems and method are provided for determining a reliability of a physically unclonable function (PUF) cell of a device. One or more activation signals are provided to a PUF cell under a plurality of conditions. A PUF cell output provided by the PUF cell under each of the plurality of conditions is determined. A determination is made of a number of times the PUF cell output of the PUF cell is consistent. And a device classification value is determined based on the determined number of times for a plurality of PUF cells.
