US Patent Application 18365068. Memory Array and Methods of Forming Same simplified abstract

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Memory Array and Methods of Forming Same

Organization Name

Taiwan Semiconductor Manufacturing Company, Ltd.

Inventor(s)

Yu-Ming Lin of Hsinchu (TW)

Bo-Feng Young of Taipei (TW)

Sai-Hooi Yeong of Zhubei (TW)

Han-Jong Chia of Hsinchu (TW)

Chi On Chui of Hsinchu (TW)

Memory Array and Methods of Forming Same - A simplified explanation of the abstract

This abstract first appeared for US patent application 18365068 titled 'Memory Array and Methods of Forming Same

Simplified Explanation

The patent application describes a device that includes a semiconductor substrate and multiple word lines and gate electrodes for transistors.

  • The device has a first word line that provides a gate electrode for a first transistor and a second word line that provides a gate electrode for a second transistor.
  • The second word line is insulated from the first word line by a dielectric material.
  • The device also includes a source line and a bit line that intersect with the word lines.
  • A memory film is located between the first word line and the source line.
  • A first semiconductor material is present between the memory film and the source line.


Original Abstract Submitted

A device includes a semiconductor substrate; a first word line over the semiconductor substrate, the first word line providing a first gate electrode for a first transistor; and a second word line over the first word line. The second word line is insulated from the first word line by a first dielectric material, and the second word line providing a second gate electrode for a second transistor over the first transistor. The device further including a source line intersecting the first word line and the second word line; a bit line intersecting the first word line and the second word line; a memory film between the first word line and the source line; and a first semiconductor material between the memory film and the source line.