US Patent Application 18360849. CIRCUIT AND METHOD TO ENHANCE EFFICIENCY OF SEMICONDUCTOR DEVICE simplified abstract

From WikiPatents
Jump to navigation Jump to search

CIRCUIT AND METHOD TO ENHANCE EFFICIENCY OF SEMICONDUCTOR DEVICE

Organization Name

TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD.

Inventor(s)

BEI-SHING Lien of TAIPEI CITY (TW)

JAW-JUINN Horng of HSINCHU (TW)

CIRCUIT AND METHOD TO ENHANCE EFFICIENCY OF SEMICONDUCTOR DEVICE - A simplified explanation of the abstract

This abstract first appeared for US patent application 18360849 titled 'CIRCUIT AND METHOD TO ENHANCE EFFICIENCY OF SEMICONDUCTOR DEVICE

Simplified Explanation

The patent application describes a method of operating a circuit that includes an operational amplifier, sampling switches, holding switches, and combined switches.

  • The method involves four phases of operation.
  • In the first phase, the sampling switches are closed, the holding switches are open, and the combined switches are open.
  • In the second phase, the combined switches are closed.
  • In the third phase, the sampling switches are open, the holding switches are closed, and the combined switches are open.
  • In the fourth phase, the sampling switches are open, the holding switches are closed, and the combined switches are closed.


Original Abstract Submitted

A method of operating a circuit includes providing the circuit, the circuit includes an operational amplifier, a plurality of sampling switches, a plurality of holding switches, and a plurality of combined switches. The method further includes: during a first phase, causing the plurality of sampling switches to be closed, the plurality of the holding switches to be open, and the plurality of combined switches to be open; during a second phase, causing the plurality of combined switches to be closed; during a third phase, causing the plurality of sampling switches to be open, the plurality of the holding switches to be closed, and the plurality of combined switches to be open; and during a fourth phase, causing the plurality of sampling switches to be open, the plurality of the holding switches to be closed, and the plurality of combined switches to be closed.