US Patent Application 18343120. SAMPLING ASSEMBLY AND SAMPLING METHOD simplified abstract

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SAMPLING ASSEMBLY AND SAMPLING METHOD

Organization Name

HUAWEI TECHNOLOGIES CO., LTD.


Inventor(s)

Haifei Wang of Chengdu (CN)


Yan Zhuang of Nanjing (CN)


Wan Zhou of Chengdu (CN)


SAMPLING ASSEMBLY AND SAMPLING METHOD - A simplified explanation of the abstract

  • This abstract for appeared for US patent application number 18343120 Titled 'SAMPLING ASSEMBLY AND SAMPLING METHOD'

Simplified Explanation

This abstract describes a sampling assembly and method that includes a self-calibration unit. The self-calibration unit controls switches to enable input and output of sampling signals. It also generates calibration signals and determines an error signal based on these signals. The self-calibration unit then uses the error signal to obtain a calibrated sampling signal.


Original Abstract Submitted

A sampling assembly and a sampling method are provided. A self-calibration unit controls a first switch to be turned on, to enable a first sampling signal to be input to a sampling unit. The sampling unit processes the first sampling signal to obtain a second sampling signal, and outputs the second sampling signal to the self-calibration unit. The self-calibration unit controls the first switch to be turned off, controls a second switch to be turned on, and outputs a first calibration signal to the sampling unit. The sampling unit processes the first calibration signal to obtain a second calibration signal, and outputs the second calibration signal to the self-calibration unit. The self-calibration unit determines an error signal based on the first calibration signal and the second calibration signal. The self-calibration unit obtains a calibrated third sampling signal based on the second sampling signal and the error signal.