US Patent Application 18320858. OPTICAL SYSTEM AND INSPECTION APPARATUS simplified abstract

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OPTICAL SYSTEM AND INSPECTION APPARATUS

Organization Name

CANON KABUSHIKI KAISHA==Inventor(s)==

[[Category:HIROTO Kano of Tochigi (JP)]]

OPTICAL SYSTEM AND INSPECTION APPARATUS - A simplified explanation of the abstract

This abstract first appeared for US patent application 18320858 titled 'OPTICAL SYSTEM AND INSPECTION APPARATUS

Simplified Explanation

The abstract describes an inspection apparatus designed to detect light from the eyes of a subject.

  • The apparatus includes an optical system and an image sensor with a pixel that has a microlens, a first conversion portion, and a second conversion portion.
  • The optical system focuses the light from the first eye onto the microlens through a first pupil, and the light from the second eye onto the microlens through a second pupil.
  • The microlens directs the light from the first eye to the first conversion portion and the light from the second eye to the second conversion portion.


Original Abstract Submitted

An inspection apparatus configured to detect first light from a first eye of a subject and second light from a second eye of the subject includes an optical system, and an image sensor, wherein the image sensor includes a pixel including a microlens, a first conversion portion, and a second conversion portion, wherein the optical system focuses the first light on the microlens via a first pupil and focuses the second light on the microlens via a second pupil, and wherein the microlens causes the first light to enter the first conversion portion and causes the second light to enter the second conversion portion.

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