US Patent Application 18212981. FAULT DETECTION DISPLAY APPARATUS AND OPERATION METHOD THEREOF simplified abstract

From WikiPatents
Jump to navigation Jump to search

FAULT DETECTION DISPLAY APPARATUS AND OPERATION METHOD THEREOF

Organization Name

Samsung Electronics Co., Ltd.


Inventor(s)

YILHO Lee of SEOUL (KR)


YONGIL Kwon of SUWON-SI (KR)


SUGYEUNG Kang of SUWON-SI (KR)


TAE-HYEON Kwon of SEOUL (KR)


SUNKWON Kim of HWASEONG-SI (KR)


HYUNSANG Park of SEONGNAM-SI (KR)


UIJONG Song of SUWON-SI (KR)


FAULT DETECTION DISPLAY APPARATUS AND OPERATION METHOD THEREOF - A simplified explanation of the abstract

  • This abstract for appeared for US patent application number 18212981 Titled 'FAULT DETECTION DISPLAY APPARATUS AND OPERATION METHOD THEREOF'

Simplified Explanation

The abstract describes an integrated circuit panel that is capable of detecting faults in a driving circuit. The panel includes a driving circuit array with two driving circuits, a data driver that outputs input data signals through data lines, a switch driver that outputs a switching signal through a switch line, and an error detection driver that receives output data signals through test lines. When the switching signal is received, the driving circuits output output data signals based on the input data signals through the test lines. The error detection driver then detects any faults in the driving circuits based on the output data signals.


Original Abstract Submitted

Disclosed is integrated circuit panel which detects fault of a driving circuit. The integrated circuit panel includes: a driving circuit array including first and second driving circuits; a data driver configured to output first and second input data signals through first and second data lines, respectively; a switch driver configured to output a switching signal through a switch line; and an error detection driver configured to receive first and second output data signals through first and second test lines, respectively, wherein, in response to the switching signal, the first and second driving circuits are configured to output the first and second output data signals, which are based on the first and second input data signal, through the first and second test lines, respectively, and the error detection driver is configured to detect a fault of the first or second driving circuit based on the first or second output data signal.