US Patent Application 18198577. APPARATUS AND METHOD FOR SIMULATION AUTOMATION IN REGRESSION TEST simplified abstract

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APPARATUS AND METHOD FOR SIMULATION AUTOMATION IN REGRESSION TEST

Organization Name

SAMSUNG ELECTRONICS CO., LTD.==Inventor(s)==

[[Category:Jicheon Kim of Suwon-si (KR)]]

[[Category:Jinwoo Park of Suwon-si (KR)]]

[[Category:Yeonho Jeong of Suwon-si (KR)]]

[[Category:Seonil Brian Choi of Suwon-si (KR)]]

APPARATUS AND METHOD FOR SIMULATION AUTOMATION IN REGRESSION TEST - A simplified explanation of the abstract

This abstract first appeared for US patent application 18198577 titled 'APPARATUS AND METHOD FOR SIMULATION AUTOMATION IN REGRESSION TEST

Simplified Explanation

The patent application describes a method for simulating an integrated circuit using a simulation tool.

  • The method involves providing a test case to the simulation tool and obtaining simulation results and logs from the tool.
  • A machine learning model is used to classify the test case into a specific fail class out of multiple fail classes.
  • A controller then applies a solution to the test case, generating a renewed test case.
  • The renewed test case is then provided back to the simulation tool for further testing.


Original Abstract Submitted

A method of simulating an integrated circuit includes providing at least one test case to a simulation tool, obtaining at least one first simulation result and at least one first simulation log from the simulation tool, classifying, with a first machine learning model, the at least one test case into one fail class of a plurality of fail classes, generating at least one renewed test case by applying, with a controller, a solution to the at least one test case, and providing the at least one renewed test case to the simulation tool.

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