US Patent Application 18101020. SPECTRUM EMISSION MASK VERIFICATION BASED ON EIRP MEASUREMENT simplified abstract
Contents
SPECTRUM EMISSION MASK VERIFICATION BASED ON EIRP MEASUREMENT
Organization Name
Inventor(s)
Fucheng Wang of Cupertino CA (US)
Fahmi L. Al Sabie of El Cajon CA (US)
Vikas O. Jain of Newark CA (US)
In Kwang Kim of San Diego CA (US)
Abhiram Rudrapatna Sridhar of San Jose CA (US)
Krishna Kalyanaraman of San Jose CA (US)
Ashwin Mohan of San Diego CA (US)
Anatoliy S. Ioffe of Sunnyvale CA (US)
SPECTRUM EMISSION MASK VERIFICATION BASED ON EIRP MEASUREMENT - A simplified explanation of the abstract
- This abstract for appeared for US patent application number 18101020 Titled 'SPECTRUM EMISSION MASK VERIFICATION BASED ON EIRP MEASUREMENT'
Simplified Explanation
The abstract describes a testing device that measures the power of a desired signal in a specific direction and the maximum power of that signal. It then calculates the difference between these two powers. The device also measures the power of a spectral emission mask (SEM) at different frequency ranges in the same direction. By comparing the difference in power between the SEM and the desired signal, the device determines the total radiated power (TRP) at each frequency range. It then checks if the TRP meets a specified SEM requirement and reports the result.
Original Abstract Submitted
A testing device determines an Effective Isotropic Radiated Power (EIRP) of a wanted signal at a beam-peak direction and a maximum Total Radiated Power (TRP) of the wanted signal. The testing device then determines a power difference (ΔP) between the EIRP of the wanted signal at the beam-peak direction and the maximum TRP of the wanted signal. The testing device determines EIRP of a spectral emission mask (SEM) at each measurement bandwidth step at the beam-peak direction. The testing device then determines TRP at each measurement bandwidth step by determining a difference between the EIRP of the SEM at that measurement bandwidth step and the power difference (ΔP). The testing device compares the TRP at each measurement bandwidth step to a SEM specification, and reports whether the SEM specification has been met.
