US Patent Application 18087627. ELECTRONIC DEVICE AND ELECTRONIC DEVICE TESTING METHOD simplified abstract

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ELECTRONIC DEVICE AND ELECTRONIC DEVICE TESTING METHOD

Organization Name

Samsung Display Co., LTD.

Inventor(s)

Kihyun Pyun of Yongin-si (KR)

Jang-Mi Lee of Yongin-si (KR)

ELECTRONIC DEVICE AND ELECTRONIC DEVICE TESTING METHOD - A simplified explanation of the abstract

This abstract first appeared for US patent application 18087627 titled 'ELECTRONIC DEVICE AND ELECTRONIC DEVICE TESTING METHOD

Simplified Explanation

The patent application describes an electronic device with a display panel divided into two regions.

  • The device includes multiple circuit films, circuit boards, and cables for connecting various components.
  • The main circuit board has a power generation unit that supplies power to the display panel.
  • There are two power measurement units, one for each region, that measure the current provided to each region.
  • An overcurrent protection unit is included to cut off power if the current exceeds a reference value.


Original Abstract Submitted

An electronic device includes: a display panel including an active area including a first region and a second region, a plurality of first circuit films, a plurality of second circuit films, a first circuit board, a second circuit board, a first circuit cable, a second circuit cable, and a main circuit board. The main circuit board includes: a power generation unit, which provides power to the display panel, a first power measurement unit electrically connected to the first circuit cable and the power generation unit, and, which measures a first current provided to the first region, a second power measurement unit electrically connected to the second circuit cable and the power generation unit, and, which measures a second current provided to the second region, and an overcurrent protection unit, which cuts off the power based on the reference current and each of the first and second currents.