US Patent Application 17887775. SEMICONDUCTOR STRUCTURE AND MANUFACTURING METHOD THEREOF simplified abstract

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SEMICONDUCTOR STRUCTURE AND MANUFACTURING METHOD THEREOF

Organization Name

CHANGXIN MEMORY TECHNOLOGIES, INC.

Inventor(s)

Yongxiang Li of Hefei (CN)

Min-Hui Chang of Hefei (CN)

SEMICONDUCTOR STRUCTURE AND MANUFACTURING METHOD THEREOF - A simplified explanation of the abstract

This abstract first appeared for US patent application 17887775 titled 'SEMICONDUCTOR STRUCTURE AND MANUFACTURING METHOD THEREOF

Simplified Explanation

The patent application describes a semiconductor structure and a method for manufacturing it.

  • The method involves providing a substrate and creating an ion implantation area within the substrate.
  • An initial word line trench is formed in the substrate, extending from the surface into the ion implantation area.
  • The initial trench is then widened to create a word line trench, with the bottom of the trench being wider than the minimum width required.
  • The purpose of widening the trench is not specified in the abstract.


Original Abstract Submitted

A semiconductor structure and a manufacturing method thereof are provided. The manufacturing method includes: providing a substrate; forming an ion implantation area in the substrate, an upper surface of the ion implantation area having a distance from an upper surface of the substrate; forming an initial word line trench in the substrate, the initial word line trench extending from the upper surface of the substrate into the ion implantation area; widening the initial word line trench to form a word line trench, a width of a bottom of the word line trench being greater than a minimum width of the word line trench.