US Patent Application 17856771. DIE FAMILY MANAGEMENT ON A MEMORY DEVICE USING BLOCK FAMILY ERROR AVOIDANCE simplified abstract
Contents
DIE FAMILY MANAGEMENT ON A MEMORY DEVICE USING BLOCK FAMILY ERROR AVOIDANCE
Organization Name
Inventor(s)
Steven Michael Kientz of Westminster CO (US)
DIE FAMILY MANAGEMENT ON A MEMORY DEVICE USING BLOCK FAMILY ERROR AVOIDANCE - A simplified explanation of the abstract
This abstract first appeared for US patent application 17856771 titled 'DIE FAMILY MANAGEMENT ON A MEMORY DEVICE USING BLOCK FAMILY ERROR AVOIDANCE
Simplified Explanation
The patent application describes a method for identifying a target block family in a memory device based on program erase cycles (PECs).
- Target block family refers to a group of blocks within the memory device.
- The identification process is done periodically after a predetermined number of PECs.
- Each block family consists of multiple blocks.
- The method involves obtaining the temporal voltage shift of each block in a subset of blocks within the target block family.
- This voltage shift is measured for each die (a component of the memory device) associated with the target block family.
- A die measurement is calculated for each die by averaging the temporal voltage shifts of the subset of blocks.
- The die measurements are then used to assign each die to a specific die family.
- The die families are consecutive groups of dies within the memory device.
Original Abstract Submitted
A target block family of a plurality of block families is identified periodically every predetermined number of program erase cycles (PECs) of a memory device. Each block family includes a plurality of blocks. A respective temporal voltage shift of each block of a subset of blocks of the target block family from each die of a plurality of dies associated with the target block family is obtained. A respective die measurement for each respective die is obtained based on an average of the respective temporal voltage shifts of the subset of blocks from each die. Each respective die to a respective die family of a plurality of consecutive die families is assigned based on the respective die measurement for each respective die.
