US Patent Application 17827220. DETERMINING THE CRITICAL MICELLE CONCENTRATION UTILIZING SEDIMENTATION VELOCITY PROFILES simplified abstract
DETERMINING THE CRITICAL MICELLE CONCENTRATION UTILIZING SEDIMENTATION VELOCITY PROFILES
Organization Name
Inventor(s)
Ahmed Wasel Alsmaeil of Dhahran (SA)
Mohammad Faisal Alhassani of Dhahran (SA)
DETERMINING THE CRITICAL MICELLE CONCENTRATION UTILIZING SEDIMENTATION VELOCITY PROFILES - A simplified explanation of the abstract
This abstract first appeared for US patent application 17827220 titled 'DETERMINING THE CRITICAL MICELLE CONCENTRATION UTILIZING SEDIMENTATION VELOCITY PROFILES
Simplified Explanation
- The patent application describes a method for measuring the critical micelle concentration of a surfactant solution. - The method involves preparing surfactant solutions with different concentrations of the surfactant. - The transmittance profiles of the surfactant solutions are measured using a dispersion analyser under centrifugal force. - Changes in the transmittance profiles are translated into a sedimentation velocity. - A relationship between the sedimentation velocity and the surfactant concentration is used to determine the critical micelle concentration of the surfactant.
Original Abstract Submitted
A method for measuring the critical micelle concentration of a surfactant solution is provided. The method includes preparing surfactant solutions with different concentration of the surfactant, measuring transmittance profiles of the surfactant solutions in a dispersion analyser under centrifugal force, translating changes in the transmittance profiles of the surfactant solutions to a sedimentation velocity, and using a relationship between the sedimentation velocity and the surfactant concentration to determine the critical micelle concentration of the surfactant.
