Pages that link to "Category:Zhenming Zhou of San Jose CA (US)"
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The following pages link to Category:Zhenming Zhou of San Jose CA (US):
View (previous 50 | next 50) (20 | 50 | 100 | 250 | 500)- US Patent Application 17752590. ADAPTIVE POROGRAMMING DELAY SCHEME IN A MEMORY SUB-SYSTEM simplified abstract (← links)
- Patent Applications Report for 8th Dec 2023 (← links)
- US Patent Application 17887244. VOLTAGE WINDOW ADJUSTMENT simplified abstract (← links)
- US Patent Application 17938307. APPARATUS WITH READ LEVEL MANAGEMENT AND METHODS FOR OPERATING THE SAME simplified abstract (← links)
- US Patent Application 17830625. ADAPTIVE ENHANCED CORRECTIVE READ BASED ON WRITE AND READ TEMPERATURE simplified abstract (← links)
- US Patent Application 17830802. DYNAMIC READ LEVEL TRIM SELECTION FOR SCAN OPERATIONS OF MEMORY DEVICES simplified abstract (← links)
- 17887244. VOLTAGE WINDOW ADJUSTMENT simplified abstract (Micron Technology, Inc.) (← links)
- 17938307. APPARATUS WITH READ LEVEL MANAGEMENT AND METHODS FOR OPERATING THE SAME simplified abstract (Micron Technology, Inc.) (← links)
- 17830625. ADAPTIVE ENHANCED CORRECTIVE READ BASED ON WRITE AND READ TEMPERATURE simplified abstract (Micron Technology, Inc.) (← links)
- 17830802. DYNAMIC READ LEVEL TRIM SELECTION FOR SCAN OPERATIONS OF MEMORY DEVICES simplified abstract (Micron Technology, Inc.) (← links)
- 17858731. ADAPTIVE WEAR LEVELING FOR ENDURANCE COMPENSATION simplified abstract (Micron Technology, Inc.) (← links)
- 17842278. ERROR AVOIDANCE FOR PARTIALLY PROGRAMMED BLOCKS OF A MEMORY DEVICE simplified abstract (Micron Technology, Inc.) (← links)
- 17876346. MEMORY CELL VOLTAGE LEVEL SELECTION simplified abstract (Micron Technology, Inc.) (← links)
- 17938153. APPARATUS WITH READ LEVEL MANAGEMENT AND METHODS FOR OPERATING THE SAME simplified abstract (Micron Technology, Inc.) (← links)
- 18205083. MEMORY SUB-SYSTEM THRESHOLD VOLTAGE MODIFICATION OPERATIONS simplified abstract (Micron Technology, Inc.) (← links)
- 17874828. RELIABILITY BASED DATA VERIFICATION simplified abstract (Micron Technology, Inc.) (← links)
- 17888171. ADAPTIVE SENSING TIME FOR MEMORY OPERATIONS simplified abstract (Micron Technology, Inc.) (← links)
- 17888080. ADAPTIVE BITLINE VOLTAGE FOR MEMORY OPERATIONS simplified abstract (Micron Technology, Inc.) (← links)
- 17888225. ADAPTIVE SENSING TIME FOR MEMORY OPERATIONS simplified abstract (Micron Technology, Inc.) (← links)
- 17887348. INDEPENDENT SENSING TIMES simplified abstract (Micron Technology, Inc.) (← links)
- 17819826. DETECTING A MEMORY WRITE RELIABILITY RISK WITHOUT USING A WRITE VERIFY OPERATION simplified abstract (Micron Technology, Inc.) (← links)
- 18388342. MANAGING WRITE DISTURB BASED ON IDENTIFICATION OF FREQUENTLY-WRITTEN MEMORY UNITS simplified abstract (Micron Technology, Inc.) (← links)
- 17897183. PROXIMITY BASED PARITY DATA MANAGEMENT simplified abstract (Micron Technology, Inc.) (← links)
- 17897184. PADDING IN FLASH MEMORY BLOCKS simplified abstract (Micron Technology, Inc.) (← links)
- 17823191. PARTIAL BLOCK READ VOLTAGE OFFSET simplified abstract (Micron Technology, Inc.) (← links)
- 17898043. NAND DETECT EMPTY PAGE SCAN simplified abstract (Micron Technology, Inc.) (← links)
- 17894528. ADAPTIVE ERROR AVOIDANCE IN THE MEMORY DEVICES simplified abstract (Micron Technology, Inc.) (← links)
- 17942977. READ LEVEL COMPENSATION FOR PARTIALLY PROGRAMMED BLOCKS OF MEMORY DEVICES simplified abstract (Micron Technology, Inc.) (← links)
- Micron technology, inc. (20240176496). OPTIMIZING DATA RELIABILITY USING ERASE RETENTION simplified abstract (← links)
- Micron technology, inc. (20240176508). RELIABILITY GAIN IN MEMORY DEVICES WITH ADAPTIVELY SELECTED ERASE POLICIES simplified abstract (← links)
- Micron technology, inc. (20240177781). READ OPERATION WITH CAPACITY USAGE DETECTION SCHEME simplified abstract (← links)
- Micron technology, inc. (20240177795). DYNAMIC READ CALIBRATION simplified abstract (← links)
- 18514926. OPTIMIZING DATA RELIABILITY USING ERASE RETENTION simplified abstract (Micron Technology, Inc.) (← links)
- 18521458. RELIABILITY GAIN IN MEMORY DEVICES WITH ADAPTIVELY SELECTED ERASE POLICIES simplified abstract (Micron Technology, Inc.) (← links)
- 18388506. READ OPERATION WITH CAPACITY USAGE DETECTION SCHEME simplified abstract (Micron Technology, Inc.) (← links)
- 18519248. DYNAMIC READ CALIBRATION simplified abstract (Micron Technology, Inc.) (← links)
- Micron technology, inc. (20240185924). PASS VOLTAGE ADJUSTMENT FOR PROGRAM OPERATION IN A MEMORY DEVICE WITH A DEFECTIVE DECK simplified abstract (← links)
- Micron technology, inc. (20240185931). PROGRAM VERIFY COMPENSATION IN A MEMORY DEVICE WITH A DEFECTIVE DECK simplified abstract (← links)
- Micron technology, inc. (20240185934). PROGRAM VERIFY COMPENSATION BY SENSING TIME MODULATION IN A MEMORY DEVICE WITH A DEFECTIVE DECK simplified abstract (← links)
- Micron technology, inc. (20240185935). BITLINE VOLTAGE ADJUSTMENT FOR PROGRAM OPERATION IN A MEMORY DEVICE WITH A DEFECTIVE DECK simplified abstract (← links)
- Micron technology, inc. (20240203502). BITLINE VOLTAGE ADJUSTMENT FOR PROGRAM OPERATION IN A MEMORY DEVICE simplified abstract (← links)
- Micron technology, inc. (20240203503). PROGRAM VERIFY LEVEL ADJUSTMENT FOR PROGRAM OPERATION IN A MEMORY DEVICE simplified abstract (← links)
- Micron technology, inc. (20240203504). SENSING TIME ADJUSTMENT FOR PROGRAM OPERATION IN A MEMORY DEVICE simplified abstract (← links)
- Micron technology, inc. (20240203513). PASS VOLTAGE ADJUSTMENT FOR PROGRAM OPERATION IN A MEMORY DEVICE simplified abstract (← links)
- Micron technology, inc. (20240231641). MANAGING ALLOCATION OF SUB-BLOCKS IN A MEMORY SUB-SYSTEM simplified abstract (← links)
- Micron technology, inc. (20240231644). APPARATUS WITH TIME-BASED READ LEVEL MANAGEMENT AND METHODS FOR OPERATING THE SAME simplified abstract (← links)
- Micron technology, inc. (20240231666). EMPTY PAGE SCAN OPERATIONS ADJUSTMENT simplified abstract (← links)
- Micron technology, inc. (20240233843). SELECTIVE DATA PATTERN WRITE SCRUB FOR A MEMORY SYSTEM simplified abstract (← links)
- 18402306. MANAGING ALLOCATION OF SUB-BLOCKS IN A MEMORY SUB-SYSTEM simplified abstract (Micron Technology, Inc.) (← links)
- 18610770. APPARATUS WITH TIME-BASED READ LEVEL MANAGEMENT AND METHODS FOR OPERATING THE SAME simplified abstract (Micron Technology, Inc.) (← links)
