Category:Scott E. Schaefer of Boise ID (US)
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Scott E. Schaefer of Boise ID (US)
Executive Summary
Scott E. Schaefer of Boise ID (US) is an inventor who has filed 4 patents. Their primary areas of innovation include {in sector programmable memories, e.g. flash disk ( (2 patents), CODING; DECODING; CODE CONVERSION IN GENERAL (using fluidic means (2 patents), {Command handling arrangements, e.g. command buffers, queues, command scheduling} (1 patents), and they have worked with companies such as Lodestar Licensing Group LLC (4 patents). Their most frequent collaborators include (4 collaborations).
Patent Filing Activity
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Technology Areas
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List of Technology Areas
- G06F11/1068 ({in sector programmable memories, e.g. flash disk (): 2 patents
- H03M13/2906 (CODING; DECODING; CODE CONVERSION IN GENERAL (using fluidic means): 2 patents
- G06F3/0659 ({Command handling arrangements, e.g. command buffers, queues, command scheduling}): 1 patents
- G06F3/0607 ({by facilitating the process of upgrading existing storage systems, e.g. for improving compatibility between host and storage device}): 1 patents
- G06F3/0658 ({Controller construction arrangements}): 1 patents
- G06F3/0688 ({Non-volatile semiconductor memory arrays}): 1 patents
- G06F9/30196 ({using decoder, e.g. decoder per instruction set, adaptable or programmable decoders}): 1 patents
- G06F11/1012 ({using codes or arrangements adapted for a specific type of error (): 1 patents
- G06F11/073 (Responding to the occurrence of a fault, e.g. fault tolerance): 1 patents
- G06F11/0793 ({Remedial or corrective actions (recovery from an exception in an instruction pipeline): 1 patents
- G06F13/28 (using burst mode transfer, e.g. direct memory access {DMA}, cycle steal (): 1 patents
- G06F11/1076 ({Parity data used in redundant arrays of independent storages, e.g. in RAID systems}): 1 patents
- G11C11/221 ({using ferroelectric capacitors}): 1 patents
- G11C11/4087 ({Address decoders, e.g. bit - or word line decoders; Multiple line decoders}): 1 patents
- G11C11/4091 (Sense or sense/refresh amplifiers, or associated sense circuitry, e.g. for coupled bit-line precharging, equalising or isolating): 1 patents
Companies
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List of Companies
- Lodestar Licensing Group LLC: 4 patents
Collaborators
- Aaron P. Boehm of Boise ID (US) (4 collaborations)
Subcategories
This category has the following 2 subcategories, out of 2 total.
Pages in category "Scott E. Schaefer of Boise ID (US)"
The following 43 pages are in this category, out of 43 total.
1
- 17807303. MEMORY SECTION SELECTION FOR A MEMORY BUILT-IN SELF-TEST simplified abstract (Micron Technology, Inc.)
- 17807307. REFRESH RATE SELECTION FOR A MEMORY BUILT-IN SELF-TEST simplified abstract (Micron Technology, Inc.)
- 17807314. ENABLING OR DISABLING ON-DIE ERROR-CORRECTING CODE FOR A MEMORY BUILT-IN SELF-TEST simplified abstract (Micron Technology, Inc.)
- 17807813. EVALUATION OF MEMORY DEVICE HEALTH MONITORING LOGIC simplified abstract (Micron Technology, Inc.)
- 17808043. INTERRUPTING A MEMORY BUILT-IN SELF-TEST simplified abstract (Micron Technology, Inc.)
- 17815742. INDICATING A STATUS OF A MEMORY BUILT-IN SELF-TEST USING A DATA MASK INVERSION BIT simplified abstract (Micron Technology, Inc.)
- 17821924. SINGLE-BIT ERROR INDICATION FOR A MEMORY BUILT-IN SELF-TEST simplified abstract (Micron Technology, Inc.)
- 17851721. MEMORY FAULT NOTIFICATION simplified abstract (MICRON TECHNOLOGY, INC.)
- 17862082. DIFFERENTIAL STROBE FAULT INDICATION simplified abstract (Micron Technology, Inc.)
- 17938898. ERROR DETECTION AND CLASSIFICATION AT A MEMORY DEVICE simplified abstract (Micron Technology, Inc.)
- 17959902. ERROR STATUS DETERMINATION AT A MEMORY DEVICE simplified abstract (Micron Technology, Inc.)
- 18049454. COMMAND ADDRESS FAULT DETECTION USING A PARITY PIN simplified abstract (Micron Technology, Inc.)
- 18213732. MEMORY DEVICE WITH STATUS FEEDBACK FOR ERROR CORRECTION simplified abstract (MICRON TECHNOLOGY, INC.)
- 18369540. TARGETED COMMAND/ADDRESS PARITY LOW LIFT simplified abstract (Lodestar Licensing Group LLC)
- 18435679. METHODS AND DEVICES FOR ERROR CORRECTION simplified abstract (Lodestar Licensing Group LLC)
- 18435710. COORDINATED ERROR PROTECTION simplified abstract (MICRON TECHNOLOGY, INC.)
- 18443948. DIFFERENTIAL STROBE FAULT IDENTIFICATION simplified abstract (Micron Technology, Inc.)
- 18584385. MEMORY DIE FAULT DETECTION USING A CALIBRATION PIN simplified abstract (Micron Technology, Inc.)
- 18590671. TECHNIQUES FOR INDICATING A WRITE LINK ERROR simplified abstract (Micron Technology, Inc.)
- 18594795. MANAGING ERROR CONTROL INFORMATION USING A REGISTER simplified abstract (Micron Technology, Inc.)
- 18604227. ERROR CORRECTION MEMORY DEVICE WITH FAST DATA ACCESS simplified abstract (Micron Technology, Inc.)
- 18608460. REDUNDANCY-BASED ERROR DETECTION IN A MEMORY DEVICE simplified abstract (MICRON TECHNOLOGY, INC.)
- 18630614. MEMORY DEVICE HEALTH MONITORING LOGIC simplified abstract (Micron Technology, Inc.)
- 18680470. EVALUATION OF MEMORY DEVICE HEALTH MONITORING LOGIC simplified abstract (Micron Technology, Inc.)
- 18748620. INTERRUPTING A MEMORY BUILT-IN SELF-TEST simplified abstract (Micron Technology, Inc.)
- 18756406. INDICATING A STATUS OF A MEMORY BUILT-IN SELF-TEST FOR MULTIPLE MEMORY DEVICE RANKS simplified abstract (Micron Technology, Inc.)
M
- Micron technology, inc. (20240126447). ADDRESS VERIFICATION AT A MEMORY DEVICE simplified abstract
- Micron technology, inc. (20240127902). INDICATING A STATUS OF A MEMORY BUILT-IN SELF-TEST simplified abstract
- Micron technology, inc. (20240220354). COORDINATED ERROR PROTECTION simplified abstract
- Micron technology, inc. (20240220361). REDUNDANCY-BASED ERROR DETECTION IN A MEMORY DEVICE simplified abstract
- Micron technology, inc. (20240232008). COMMAND ADDRESS FAULT DETECTION USING A PARITY PIN simplified abstract
- Micron technology, inc. (20240250699). MANAGING ERROR CONTROL INFORMATION USING A REGISTER simplified abstract
- Micron technology, inc. (20240256187). TEMPERATURE MONITORING FOR MEMORY DEVICES simplified abstract
- Micron technology, inc. (20240264767). TECHNIQUES FOR DETECTING A STATE OF A BUS simplified abstract
- Micron technology, inc. (20240265991). BIT RETIRING TO MITIGATE BIT ERRORS simplified abstract
- Micron technology, inc. (20240282400). DIFFERENTIAL STROBE FAULT IDENTIFICATION simplified abstract
- Micron technology, inc. (20240303157). MEMORY DIE FAULT DETECTION USING A CALIBRATION PIN simplified abstract
- Micron technology, inc. (20240303158). ERROR CORRECTION MEMORY DEVICE WITH FAST DATA ACCESS simplified abstract
- Micron technology, inc. (20240320093). EVALUATION OF MEMORY DEVICE HEALTH MONITORING LOGIC simplified abstract
- Micron technology, inc. (20240339170). INTERRUPTING A MEMORY BUILT-IN SELF-TEST simplified abstract
- Micron technology, inc. (20240345932). MEMORY DEVICE HEALTH MONITORING LOGIC simplified abstract
- Micron technology, inc. (20240347125). INDICATING A STATUS OF A MEMORY BUILT-IN SELF-TEST FOR MULTIPLE MEMORY DEVICE RANKS simplified abstract
- Micron technology, inc. (20240412801). TECHNIQUES FOR DETECTING A STATE OF A BUS
