Advantest Corporation Patent Application Trends in 2025

Advantest Corporation patent applications in 2025

Top 10 Technology Areas

• G01R31/311 (MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES (indicating correct tuning of resonant circuits)
  • Count: 2 patents
  • Example: 20250067800. TESTING APPARATUS, TESTING METHOD, AND COMPUTER-READABLE STORAGE MEDIUM (ADVANTEST CORPORATION)
• G01R31/2867 (Testing of electronic circuits, e.g. by signal tracer ({EMC, EMP or similar testing of electronic circuits)
  • Count: 2 patents
  • Example: 20250076366. SEMICONDUCTOR WAFER HANDLING APPARATUS AND SEMICONDUCTOR WAFER TESTING SYSTEM (ADVANTEST Corporation)
• G01R31/2875 (Testing of electronic circuits, e.g. by signal tracer ({EMC, EMP or similar testing of electronic circuits)
  • Count: 2 patents
  • Example: 20250076367. SEMICONDUCTOR WAFER HANDLING APPARATUS AND SEMICONDUCTOR WAFER TESTING SYSTEM (ADVANTEST Corporation)
• G01R31/2877 (Testing of electronic circuits, e.g. by signal tracer ({EMC, EMP or similar testing of electronic circuits)
  • Count: 2 patents
  • Example: 20250076367. SEMICONDUCTOR WAFER HANDLING APPARATUS AND SEMICONDUCTOR WAFER TESTING SYSTEM (ADVANTEST Corporation)
• G01R31/318307 (MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES (indicating correct tuning of resonant circuits)
  • Count: 1 patents
  • Example: 20250067804. AUTOMATED TEST EQUIPMENT AND METHOD USING A TRIGGER GENERATION (ADVANTEST CORPORATION)
• G01R31/31907 (Tester hardware, i.e. output processing circuits)
  • Count: 1 patents
  • Example: 20250067804. AUTOMATED TEST EQUIPMENT AND METHOD USING A TRIGGER GENERATION (ADVANTEST CORPORATION)
• G01R31/31908 (Tester hardware, i.e. output processing circuits)
  • Count: 1 patents
  • Example: 20250067804. AUTOMATED TEST EQUIPMENT AND METHOD USING A TRIGGER GENERATION (ADVANTEST CORPORATION)
• G01R31/2834 (Testing of electronic circuits, e.g. by signal tracer ({EMC, EMP or similar testing of electronic circuits)
  • Count: 1 patents
  • Example: 20250004039. METHOD AND APPARATUS FOR DETERMINING AND INFORMATION ABOUT CHARACTERISTICS OF ONE OR MORE DEVICES UNDER TEST, DUTs, USING A STATISTICALLY SIGNIFICANT DISSIMILARITY VALUE (Advantest Corporation)
• G01R33/0206 ({Three-component magnetometers})
  • Count: 1 patents
  • Example: 20250044377. IMAGE OUTPUT APPARATUS, METHOD, PROGRAM, AND RECORDING MEDIUM (ADVANTEST CORPORATION)
• G01N27/72 (INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES (measuring or testing processes other than immunoassay, involving enzymes or microorganisms)
  • Count: 1 patents
  • Example: 20250044377. IMAGE OUTPUT APPARATUS, METHOD, PROGRAM, AND RECORDING MEDIUM (ADVANTEST CORPORATION)

Emerging Technology Areas

• H04L27/3483 (TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION (arrangements common to telegraphic and telephonic communication)
  • Count: 1 patents
  • Example: 20250016085. REDUCED HEADER SIGNAL INFORMATION TESTING SYSTEMS AND METHODS (Advantest Corporation)
• H04L27/2659 ({Coarse or integer frequency offset determination and synchronisation})
  • Count: 1 patents
  • Example: 20250016085. REDUCED HEADER SIGNAL INFORMATION TESTING SYSTEMS AND METHODS (Advantest Corporation)
• H04L43/50 (Testing arrangements)
  • Count: 1 patents
  • Example: 20250016085. REDUCED HEADER SIGNAL INFORMATION TESTING SYSTEMS AND METHODS (Advantest Corporation)
• H05B45/50 (responsive to malfunctions or undesirable behaviour of LEDs; responsive to LED life; Protective circuits)
  • Count: 1 patents
  • Example: 20250012847. TEST APPARATUS, TEST METHOD, AND COMPUTER-READABLE STORAGE MEDIUM (ADVANTEST CORPORATION)
• H05B45/22 (ELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL)
  • Count: 1 patents
  • Example: 20250012847. TEST APPARATUS, TEST METHOD, AND COMPUTER-READABLE STORAGE MEDIUM (ADVANTEST CORPORATION)
• H05B45/12 (ELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL)
  • Count: 1 patents
  • Example: 20250012847. TEST APPARATUS, TEST METHOD, AND COMPUTER-READABLE STORAGE MEDIUM (ADVANTEST CORPORATION)
• G01R31/31728 (MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES (indicating correct tuning of resonant circuits)
  • Count: 1 patents
  • Example: 20250012847. TEST APPARATUS, TEST METHOD, AND COMPUTER-READABLE STORAGE MEDIUM (ADVANTEST CORPORATION)
• G01R31/2635 (Testing of individual semiconductor devices (testing or measuring during manufacture or treatment {)
  • Count: 1 patents
  • Example: 20250012847. TEST APPARATUS, TEST METHOD, AND COMPUTER-READABLE STORAGE MEDIUM (ADVANTEST CORPORATION)
• B01L2300/123 (CHEMICAL OR PHYSICAL LABORATORY APPARATUS FOR GENERAL USE)
  • Count: 1 patents
  • Example: 20250010292. MICROFLUIDIC DEVICE AND MICROPARTICLE MEASUREMENT SYSTEM (ADVANTEST CORPORATION)
• B01L2300/0861 (CHEMICAL OR PHYSICAL LABORATORY APPARATUS FOR GENERAL USE)
  • Count: 1 patents
  • Example: 20250010292. MICROFLUIDIC DEVICE AND MICROPARTICLE MEASUREMENT SYSTEM (ADVANTEST CORPORATION)

Top Inventors

• Aritomo Kikuchi (3 patents)
• Kotaro HASEGAWA (2 patents)
• Toshiyuki Kiyokawa (2 patents)
• Koji MIYAUCHI (1 patent)
• Matthias SAUER (1 patent)
• Olaf PÖPPE (1 patent)
• Jochen RIVOIR (1 patent)
• Tomonori YANAGIDA (1 patent)
• Yuji OGATA (1 patent)
• Takao SAKURAI (1 patent)

Patent Categories

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Geographical Distribution of Inventors

Geographical Distribution of US Inventors

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