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20250220991. Integrated Circuit Structure (Intel)

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INTEGRATED CIRCUIT STRUCTURE WITH DIRECT BACKSIDE SOURCE OR DRAIN CONTACT

Abstract: integrated circuit structures having direct backside source or drain contacts are described. in an example, an integrated circuit structure includes first, second and third pluralities of horizontally stacked nanowires or fins, and first, second and third gate stacks. a first epitaxial source or drain structure is between the first plurality of horizontally stacked nanowires or fin and the second plurality of horizontally stacked nanowires or fin, the first epitaxial source or drain structure over and electrically coupled to a corresponding conductive backside contact that extends laterally beyond the first epitaxial source or drain structure without contacting the first gate stack or the second gate stack. a second epitaxial source or drain structure is between the second plurality of horizontally stacked nanowires or fin and the third plurality of horizontally stacked nanowires or fin.

Inventor(s): Shao Ming KOH, Conor P. PULS, Mauro J. KOBRINSKY, Giorgio MARIOTTINI, June CHOI, Shawna M. LIFF, Jack T. KAVALIEROS, Sean PURSEL, Dimitri KIOUSSIS, Joseph D’SILVA, Ehren MANNEBACH, Shaun MILLS, Umang DESAI, Makram ABD EL QADER

CPC Classification: H10D62/121 (No explanation available)

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