View source for US Patent Application 18031573. MAKING A MEASUREMENT RELATING TO AN OBJECT DEPENDING ON A DERIVED MEASUREMENT SURFACE simplified abstract

=MAKING A MEASUREMENT RELATING TO AN OBJECT DEPENDING ON A DERIVED MEASUREMENT SURFACE=


==Organization Name==

[[:Category:Hewlett-Packard Development Company, L.P.|Hewlett-Packard Development Company, L.P.]]


[[Category:Hewlett-Packard Development Company, L.P.]]

==Inventor(s)==

[[:Category:Faisal Azhar of Bristol (GB)|Faisal Azhar of Bristol (GB)]][[Category:Faisal Azhar of Bristol (GB)]]

[[:Category:Stephen Pollard of Bristol (GB)|Stephen Pollard of Bristol (GB)]][[Category:Stephen Pollard of Bristol (GB)]]

[[:Category:Sven Molkenstruck of Braunschweig (DE)|Sven Molkenstruck of Braunschweig (DE)]][[Category:Sven Molkenstruck of Braunschweig (DE)]]

[[:Category:Guy Adams of Bristol (GB)|Guy Adams of Bristol (GB)]][[Category:Guy Adams of Bristol (GB)]]

==MAKING A MEASUREMENT RELATING TO AN OBJECT DEPENDING ON A DERIVED MEASUREMENT SURFACE - A simplified explanation of the abstract==


This abstract first appeared for US patent application 18031573 titled 'MAKING A MEASUREMENT RELATING TO AN OBJECT DEPENDING ON A DERIVED MEASUREMENT SURFACE

==Simplified Explanation==

- The patent application describes a method for making a measurement on an object manufactured according to a model.
- The object has a measured surface that deviates from the corresponding surface of the model.
- The method involves obtaining measured surface data that represents the surface deviation of at least a portion of the object.
- A statistical analysis is performed on the measured surface data to determine a measurement surface that corresponds to the object's surface.
- The measurement surface is offset from the measured surface data in a specific interpretation direction.
- Based on the measurement surface, a measurement relating to the object is made.


==Original Abstract Submitted==

A method of making a measurement relating to an object manufactured according to a model may be provided. The object may have a measured surface comprising a surface deviation relative to a corresponding surface of the model. The method may comprise obtaining measured surface data representing at least a portion of the measured surface comprising the said surface deviation. The method may comprise determining a measurement surface corresponding to the measured surface of the object by performing a statistical analysis of at least a portion of the measured surface data in respect of an interpretation direction such that a portion of the measured surface data is offset from the measurement surface in the interpretation direction. The method may comprise making a measurement relating to the object depending on the measurement surface.



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