US Patent Application 18031573. MAKING A MEASUREMENT RELATING TO AN OBJECT DEPENDING ON A DERIVED MEASUREMENT SURFACE simplified abstract
MAKING A MEASUREMENT RELATING TO AN OBJECT DEPENDING ON A DERIVED MEASUREMENT SURFACE
Organization Name
Hewlett-Packard Development Company, L.P.
Inventor(s)
Stephen Pollard of Bristol (GB)
Sven Molkenstruck of Braunschweig (DE)
MAKING A MEASUREMENT RELATING TO AN OBJECT DEPENDING ON A DERIVED MEASUREMENT SURFACE - A simplified explanation of the abstract
This abstract first appeared for US patent application 18031573 titled 'MAKING A MEASUREMENT RELATING TO AN OBJECT DEPENDING ON A DERIVED MEASUREMENT SURFACE
Simplified Explanation
- The patent application describes a method for making a measurement on an object manufactured according to a model. - The object has a measured surface that deviates from the corresponding surface of the model. - The method involves obtaining measured surface data that represents the surface deviation of at least a portion of the object. - A statistical analysis is performed on the measured surface data to determine a measurement surface that corresponds to the object's surface. - The measurement surface is offset from the measured surface data in a specific interpretation direction. - Based on the measurement surface, a measurement relating to the object is made.
Original Abstract Submitted
A method of making a measurement relating to an object manufactured according to a model may be provided. The object may have a measured surface comprising a surface deviation relative to a corresponding surface of the model. The method may comprise obtaining measured surface data representing at least a portion of the measured surface comprising the said surface deviation. The method may comprise determining a measurement surface corresponding to the measured surface of the object by performing a statistical analysis of at least a portion of the measured surface data in respect of an interpretation direction such that a portion of the measured surface data is offset from the measurement surface in the interpretation direction. The method may comprise making a measurement relating to the object depending on the measurement surface.
