View source for Qualcomm incorporated (20250138546). SENSOR MEASUREMENT GRID COMPLEXITY MANAGEMENT

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=SENSOR MEASUREMENT GRID COMPLEXITY MANAGEMENT=


==Organization Name==

[[:Category:qualcomm incorporated|qualcomm incorporated]]


[[Category:qualcomm incorporated]]

==Inventor(s)==

[[:Category:Vishnuu Appaya Dhanabalan of Munich DE|Vishnuu Appaya Dhanabalan of Munich DE]][[Category:Vishnuu Appaya Dhanabalan of Munich DE]]

[[:Category:Volodimir Slobodyanyuk of San Diego CA US|Volodimir Slobodyanyuk of San Diego CA US]][[Category:Volodimir Slobodyanyuk of San Diego CA US]]

[[:Category:Radhika Dilip Gowaikar of San Diego CA US|Radhika Dilip Gowaikar of San Diego CA US]][[Category:Radhika Dilip Gowaikar of San Diego CA US]]

[[:Category:Makesh Pravin John Wilson of San Diego CA US|Makesh Pravin John Wilson of San Diego CA US]][[Category:Makesh Pravin John Wilson of San Diego CA US]]

[[:Category:Avdhut Joshi of San Marcos CA US|Avdhut Joshi of San Marcos CA US]][[Category:Avdhut Joshi of San Marcos CA US]]

[[:Category:James Poplawski of Canton MI US|James Poplawski of Canton MI US]][[Category:James Poplawski of Canton MI US]]

==SENSOR MEASUREMENT GRID COMPLEXITY MANAGEMENT==


This abstract first appeared for US patent application 20250138546 titled 'SENSOR MEASUREMENT GRID COMPLEXITY MANAGEMENT

==Original Abstract Submitted==

techniques are provide for generating occupancy grids based on inputs from multiple heterogeneous sensors. an example method for generating an occupancy grid includes obtaining detection information from a plurality of heterogeneous sensors, generating a single measurement grid based on the detection information from the plurality of heterogeneous sensors, determining occupancy probabilities for a plurality of cells in the single measurement grid, and outputting the occupancy grid based at least in part on the occupancy probabilities.



[[Category:G05D1/246]]
[[Category:G05D109/10]]
[[Category:G05D111/10]]
[[Category:G05D111/30]]
[[Category:G05D111/67]]
[[Category:CPC_G05D1/2464]]