View source for Micron technology, inc. (20250104792). APPARATUS INCLUDING BTI CONTROLLER

=APPARATUS INCLUDING BTI CONTROLLER=


==Organization Name==

[[:Category:micron technology, inc.|micron technology, inc.]]


[[Category:micron technology, inc.]]

==Inventor(s)==

[[:Category:YASUSHI Matsubara of Isehara JP|YASUSHI Matsubara of Isehara JP]][[Category:YASUSHI Matsubara of Isehara JP]]

[[:Category:YOSHINORI Fujiwara of Boise ID US|YOSHINORI Fujiwara of Boise ID US]][[Category:YOSHINORI Fujiwara of Boise ID US]]

[[:Category:TAKUYA Tamano of Boise ID US|TAKUYA Tamano of Boise ID US]][[Category:TAKUYA Tamano of Boise ID US]]

==APPARATUS INCLUDING BTI CONTROLLER==


This abstract first appeared for US patent application 20250104792 titled 'APPARATUS INCLUDING BTI CONTROLLER

==Original Abstract Submitted==

according to one or more embodiments of the disclosure, an apparatus comprises a memory device and a bias temperature instability (bti) controller. the bti controller generates and outputs a command and address signal for memory testing. the command and address signal causes the memory device in the idle state to operate for the testing.



[[Category:G11C29/18]]
[[Category:G11C29/12]]
[[Category:CPC_G11C29/18]]