View source for 20250180520. Inspection Device (KABUSHIKI KAISHA TOSHIBA)

= INSPECTION DEVICE AND INSPECTION METHOD =

'''Abstract''':
according to one embodiment, an inspection device includes first and second transmitters, first and second receivers, a transporter, and a controller. the first transmitter includes a plurality of first transmitting elements. the first transmitting elements are arranged along a first direction and transmit a first ultrasonic wave. the second transmitter includes a plurality of second transmitting elements. the second transmitting elements are arranged along the first direction and transmit a second ultrasonic wave. the controller causes the first transmitter to transmit the first ultrasonic wave and causes the second transmitter to transmit the second ultrasonic wave. the controller supplies a first signal to the one of the plurality of first transmitting elements and supplies a first neighboring signal to the other one of the plurality of first transmitting elements. the first neighboring signal is an inversion of the first signal.

'''Inventor(s)''': [[:Category:Tomio ONO of Yokohama Kanagawa  JP|Tomio ONO]], [[:Category:Yutaka NAKAI of Yokohama Kanagawa  JP|Yutaka NAKAI]], [[:Category:Noriko YAMAMOTO of Yokohama Kanagawa  JP|Noriko YAMAMOTO]]

'''CPC Classification''': [[:Category:CPC_G01N29/32|G01N29/32]] (INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES  (measuring or testing processes other than immunoassay, involving enzymes or microorganisms , ))


[[Category:Patent Applications]]
[[Category:KABUSHIKI KAISHA TOSHIBA]]
[[Category:CPC_G01N29/32]]
[[Category:Tomio ONO of Yokohama Kanagawa  JP]]
[[Category:Yutaka NAKAI of Yokohama Kanagawa  JP]]
[[Category:Noriko YAMAMOTO of Yokohama Kanagawa  JP]]

[https://wikipatents.org/index.php?search=20250180520+rejection&title=Special%3ASearch&wprov=acrw1_-1 Search for rejections for patent application number 20250180520]


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