20250180520. Inspection Device (KABUSHIKI KAISHA TOSHIBA)
INSPECTION DEVICE AND INSPECTION METHOD
Abstract: according to one embodiment, an inspection device includes first and second transmitters, first and second receivers, a transporter, and a controller. the first transmitter includes a plurality of first transmitting elements. the first transmitting elements are arranged along a first direction and transmit a first ultrasonic wave. the second transmitter includes a plurality of second transmitting elements. the second transmitting elements are arranged along the first direction and transmit a second ultrasonic wave. the controller causes the first transmitter to transmit the first ultrasonic wave and causes the second transmitter to transmit the second ultrasonic wave. the controller supplies a first signal to the one of the plurality of first transmitting elements and supplies a first neighboring signal to the other one of the plurality of first transmitting elements. the first neighboring signal is an inversion of the first signal.
Inventor(s): Tomio ONO, Yutaka NAKAI, Noriko YAMAMOTO
CPC Classification: G01N29/32 (INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES (measuring or testing processes other than immunoassay, involving enzymes or microorganisms , ))
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