View source for 17953182. HOST DATA STORAGE SCAN DATA RETENTION RATING simplified abstract (Micron Technology, Inc.)

=HOST DATA STORAGE SCAN DATA RETENTION RATING=


==Organization Name==

[[:Category:Micron Technology, Inc.|Micron Technology, Inc.]]


[[Category:Micron Technology, Inc.]]

==Inventor(s)==

[[:Category:Vamsi Pavan Rayaprolu of Santa Clara CA (US)|Vamsi Pavan Rayaprolu of Santa Clara CA (US)]][[Category:Vamsi Pavan Rayaprolu of Santa Clara CA (US)]]

[[:Category:Thomas Lentz of Boise ID (US)|Thomas Lentz of Boise ID (US)]][[Category:Thomas Lentz of Boise ID (US)]]

==HOST DATA STORAGE SCAN DATA RETENTION RATING - A simplified explanation of the abstract==


This abstract first appeared for US patent application 17953182 titled 'HOST DATA STORAGE SCAN DATA RETENTION RATING

==Simplified Explanation==

The system described in the patent application includes a memory device with multiple dies, each containing multiple pages, and a processing device that performs operations such as scanning pages on a die, determining values of different state metrics, recording sets of values, calculating metrics corresponding to failure conditions, identifying criteria, assigning ratings to dies, and adjusting scan frequency based on ratings.

* Memory device with multiple dies and pages
* Processing device for scanning and analyzing pages
* Recording and calculating values of state metrics
* Identifying criteria and assigning ratings to dies
* Adjusting scan frequency based on ratings

== Potential Applications ==
* Quality control in semiconductor manufacturing
* Predictive maintenance in data centers
* Performance optimization in storage devices

== Problems Solved ==
* Early detection of potential failures in memory devices
* Efficient allocation of resources for maintenance
* Improved reliability and longevity of memory devices

== Benefits ==
* Increased reliability and performance of memory devices
* Cost savings through proactive maintenance
* Enhanced quality control in manufacturing processes


==Original Abstract Submitted==

A system includes a memory device containing multiple dies that each have multiple pages, and a processing device, operatively coupled with the memory device, to perform various operations including scanning a group of pages residing on a die and determining a value of one data state metric and a corresponding value of another state metric. The operations can also include recording a set of values of the first metric and a corresponding set of values of the second metric, as well as calculating the value of the second metric corresponding to a predetermined value of the first metric associated with a failure condition of the die. Additionally, the operations can include identifying a particular criterion that is satisfied by the calculated value, assigning, to the die, a rating corresponding to the identified criterion, and performing scans on the die at a frequency determined by the assigned rating.



[[Category:G06F3/06]]