17953182. HOST DATA STORAGE SCAN DATA RETENTION RATING simplified abstract (Micron Technology, Inc.)
Contents
HOST DATA STORAGE SCAN DATA RETENTION RATING
Organization Name
Inventor(s)
Vamsi Pavan Rayaprolu of Santa Clara CA (US)
HOST DATA STORAGE SCAN DATA RETENTION RATING - A simplified explanation of the abstract
This abstract first appeared for US patent application 17953182 titled 'HOST DATA STORAGE SCAN DATA RETENTION RATING
Simplified Explanation
The system described in the patent application includes a memory device with multiple dies, each containing multiple pages, and a processing device that performs operations such as scanning pages on a die, determining values of different state metrics, recording sets of values, calculating metrics corresponding to failure conditions, identifying criteria, assigning ratings to dies, and adjusting scan frequency based on ratings.
- Memory device with multiple dies and pages
- Processing device for scanning and analyzing pages
- Recording and calculating values of state metrics
- Identifying criteria and assigning ratings to dies
- Adjusting scan frequency based on ratings
Potential Applications
- Quality control in semiconductor manufacturing
- Predictive maintenance in data centers
- Performance optimization in storage devices
Problems Solved
- Early detection of potential failures in memory devices
- Efficient allocation of resources for maintenance
- Improved reliability and longevity of memory devices
Benefits
- Increased reliability and performance of memory devices
- Cost savings through proactive maintenance
- Enhanced quality control in manufacturing processes
Original Abstract Submitted
A system includes a memory device containing multiple dies that each have multiple pages, and a processing device, operatively coupled with the memory device, to perform various operations including scanning a group of pages residing on a die and determining a value of one data state metric and a corresponding value of another state metric. The operations can also include recording a set of values of the first metric and a corresponding set of values of the second metric, as well as calculating the value of the second metric corresponding to a predetermined value of the first metric associated with a failure condition of the die. Additionally, the operations can include identifying a particular criterion that is satisfied by the calculated value, assigning, to the die, a rating corresponding to the identified criterion, and performing scans on the die at a frequency determined by the assigned rating.
