There is currently no text in this page. You can search for this page title in other pages, or search the related logs, but you do not have permission to create this page.
Category:Seungyoon Lee of Suwon-si (KR)
Appearance
Pages in category "Seungyoon Lee of Suwon-si (KR)"
The following 16 pages are in this category, out of 16 total.
1
- 18154604. RECONFIGURABLE INTELLIGENT SURFACE FORMING MULTIPLE RESONANCES simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 18180210. REFLECTIVE MASK AND METHOD OF DESIGNING ANTI-REFLECTION PATTERN OF THE SAME simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 18332238. MULTI-WAVELENGTH SELECTION METHOD FOR OVERLAY MEASUREMENT, AND OVERLAY MEASUREMENT METHOD AND SEMICONDUCTOR DEVICE MANUFACTURING METHOD USING MULTI-WAVELENGTHS simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 18347129. OVERLAY CORRECTION METHOD, AND EXPOSURE METHOD AND SEMICONDUCTOR DEVICE MANUFACTURING METHOD INCLUDING OVERLAY CORRECTION METHOD simplified abstract (Samsung Electronics Co., Ltd.)
- 18454219. METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 18460929. OVERLAY MEASURING METHOD AND SYSTEM, AND METHOD OF MANUFACTURING A SEMICONDUCTOR DEVICE USING THE SAME simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 18563132. LAMINATED PATCH ANTENNA, ANTENNA ARRAY, AND ANTENNA PACKAGE simplified abstract (Samsung Electronics Co., Ltd.)
- 18662244. METHOD OF OPTIMIZING OVERLAY MEASUREMENT CONDITION AND OVERLAY MEASUREMENT METHOD USING OVERLAY MEASUREMENT CONDITION (Samsung Electronics Co., Ltd.)
- 18704019. DEVICE AND OPERATION METHOD FOR OPERATING REFLECTING INTELLIGENT SURFACE IN WIRELESS COMMUNICATION SYSTEM (SAMSUNG ELECTRONICS CO., LTD.)
- 18708975. ELECTRONIC DEVICE COMPRISING ANTENNA MODULE (SAMSUNG ELECTRONICS CO., LTD.)
S
- Samsung electronics co., ltd. (20240133683). OVERLAY MEASURING METHOD AND SYSTEM, AND METHOD OF MANUFACTURING A SEMICONDUCTOR DEVICE USING THE SAME simplified abstract
- Samsung electronics co., ltd. (20240134290). MULTI-WAVELENGTH SELECTION METHOD FOR OVERLAY MEASUREMENT, AND OVERLAY MEASUREMENT METHOD AND SEMICONDUCTOR DEVICE MANUFACTURING METHOD USING MULTI-WAVELENGTHS simplified abstract
- Samsung electronics co., ltd. (20240160115). OVERLAY CORRECTION METHOD, AND EXPOSURE METHOD AND SEMICONDUCTOR DEVICE MANUFACTURING METHOD INCLUDING OVERLAY CORRECTION METHOD simplified abstract
- Samsung electronics co., ltd. (20240222201). METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE simplified abstract
- Samsung electronics co., ltd. (20240266744). LAMINATED PATCH ANTENNA, ANTENNA ARRAY, AND ANTENNA PACKAGE simplified abstract
- Samsung electronics co., ltd. (20240421854). DEVICE AND OPERATION METHOD FOR OPERATING REFLECTING INTELLIGENT SURFACE IN WIRELESS COMMUNICATION SYSTEM