There is currently no text in this page. You can search for this page title in other pages, or search the related logs, but you do not have permission to create this page.
Category:H04B17/00
Appearance
Subcategories
This category has the following 8 subcategories, out of 8 total.
H
K
L
Q
S
V
X
Z
Pages in category "H04B17/00"
The following 30 pages are in this category, out of 30 total.
1
- 17756692. MULTIPLE-INPUT MULTIPLE-OUTPUT OVER THE AIR PERFORMANCE TESTING simplified abstract (QUALCOMM Incorporated)
- 17950075. IN-DEVICE CHARACTERIZATION OF ANTENNA COUPLING simplified abstract (QUALCOMM Incorporated)
- 17950093. IN-DEVICE CHARACTERIZATION OF ANTENNA COUPLING simplified abstract (QUALCOMM Incorporated)
- 18256195. METHOD AND DEVICE FOR PERFORMING MDT LOGGING IN CASE OF IDC PROBLEM IN WIRELESS COMMUNICATION SYSTEM simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 18288253. Enhancement of Data Map of Objects Via Object Specific Radio Frequency Parameters simplified abstract (Nokia Technologies Oy)
- 18337256. On-Chip Test Tone Generator for Built-In Spur Testing (QUALCOMM Incorporated)
- 18471345. ULTRA-WIDEBAND (UWB) RESIDUAL SIDEBAND (RSB) CALIBRATION USING BI-PHASE SHIFT KEYING (BPSK) SIGNAL SOURCE (QUALCOMM Incorporated)
- 18514179. PROPAGATION CHANNEL SIMULATION METHOD AND APPARATUS simplified abstract (ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE)
- 18611179. TRANSCEIVER BUILT-IN SELF-TEST (QUALCOMM Incorporated)
- 18906626. SIMULTANEOUS BIDIRECTIONAL SIGNALING IN THROUGH-SILICON VIAS (Marvell Asia Pte Ltd)
5
A
- Analog Devices International Unlimited Company (20240275500). APPARATUS AND METHODS FOR ELECTRONIC TESTING USING BEAMFORMING INTEGRATED CIRCUITS AS IMPEDANCE TUNERS simplified abstract
- Apple inc. (20240264210). CURRENT MODE TIME-TO-DIGITAL CONVERTER-BASED POWER DETECTOR simplified abstract
- Apple Inc. patent applications on August 8th, 2024
Q
- Qualcomm incorporated (20240097800). IN-DEVICE CHARACTERIZATION OF ANTENNA COUPLING simplified abstract
- Qualcomm incorporated (20240097801). IN-DEVICE CHARACTERIZATION OF ANTENNA COUPLING simplified abstract
- Qualcomm incorporated (20240421918). On-Chip Test Tone Generator for Built-In Spur Testing
- Qualcomm incorporated (20250007624). TRANSCEIVER BUILT-IN SELF-TEST
- Qualcomm incorporated (20250105928). ULTRA-WIDEBAND (UWB) RESIDUAL SIDEBAND (RSB) CALIBRATION USING BI-PHASE SHIFT KEYING (BPSK) SIGNAL SOURCE
- QUALCOMM Incorporated patent applications on December 19th, 2024
- QUALCOMM Incorporated patent applications on January 2nd, 2025
- QUALCOMM Incorporated patent applications on March 21st, 2024
- QUALCOMM Incorporated patent applications on March 27th, 2025
T
- Telefonaktiebolaget LM Ericsson (publ) (20240322917). OVER-THE-AIR TESTING OF AN ACTIVE ANTENNA SYSTEM simplified abstract
- Telefonaktiebolaget lm ericsson (publ) (20240322917). OVER-THE-AIR TESTING OF AN ACTIVE ANTENNA SYSTEM simplified abstract
- Telefonaktiebolaget LM Ericsson (publ) patent applications on September 26th, 2024