TRANSCEIVER BUILT-IN SELF-TEST

Organization Name

QUALCOMM Incorporated

Inventor(s)

Yunfei Feng of San Diego CA (US)

Li Liu of San Diego CA (US)

Chuan Wang of San Diego CA (US)

Vahid Dabbagh Rezaei of San Diego CA (US)

Vinod Panikkath of San Diego CA (US)

Alaaeldien Mohamed Abdelrazek Medra of San Diego CA (US)

Anosh Davierwalla of San Diego CA (US)

Xinmin Yu of San Diego CA (US)

Muhammad Hassan of San Diego CA (US)

Wu-Hsin Chen of San Diego CA (US)

Sherif Hassan Kamel Embabi of Allen TX (US)

TRANSCEIVER BUILT-IN SELF-TEST

This abstract first appeared for US patent application 18611179 titled 'TRANSCEIVER BUILT-IN SELF-TEST

Original Abstract Submitted

A method of self-testing a transceiver integrated circuit substrate includes: providing a test signal to a transmission line that is communicatively coupled, or selectively communicatively coupled, to an input of a power amplifier of a first transceiver subcircuit of the transceiver integrated circuit substrate; providing the test signal from the transmission line to an LNA of an LNA of a second transceiver subcircuit of the transceiver integrated circuit substrate; and measuring the test signal before amplification by the LNA, or after amplification by the LNA, or both.