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Category:G11C29/38
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This category has the following 5 subcategories, out of 5 total.
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Pages in category "G11C29/38"
The following 38 pages are in this category, out of 38 total.
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- 17693571. NONVOLATILE MEMORY DEVICE AND METHOD OF DETECTING WORDLINE DEFECT OF THE SAME simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 17943706. BUILT-IN SELF-TEST BURST PATTERNS BASED ON ARCHITECTURE OF MEMORY simplified abstract (Micron Technology, Inc.)
- 18116019. TEST SYSTEMS CONFIGURED TO PERFORM TEST MODE OPERATIONS FOR MULTIPLE MEMORY DEVICES simplified abstract (SK hynix Inc.)
- 18238096. TECHNOLOGIES FOR ALLOCATING RESOURCES ACROSS DATA CENTERS simplified abstract (Intel Corporation)
- 18429729. METHOD FOR TUNING AN EXTERNAL MEMORY INTERFACE simplified abstract (Texas Instruments Incorporated)
- 18529619. NONVOLATILE MEMORY PACKAGE, STORAGE DEVICE INCLUDING THE SAME, AND METHOD OF OPERATING THEREOF simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 18542308. TECHNOLOGIES FOR DYNAMIC ACCELERATOR SELECTION simplified abstract (Intel Corporation)
- 18737631. SYSTEM AND METHOD FOR CONDUCTING BUILT-IN SELF-TEST OF MEMORY MACRO simplified abstract (Taiwan Semiconductor Manufacturing Company, Ltd.)
- 18817926. MULTIPLE THRESHOLDS FOR MANAGING FLASH MEMORY (Pure Storage, Inc.)
- 18958550. OPTIMIZING VOLTAGE TUNING USING PRIOR VOLTAGE TUNING RESULTS (PURE STORAGE, INC.)
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- MENTA (20250061958). LOGIC DEVICE AND SYSTEM AND METHODS FOR DEFINITION AND CONFIGURATION OF A LOGIC DEVICE
- Micron technology, inc. (20240185915). OPTIMIZATION OF SOFT BIT WINDOWS BASED ON SIGNAL AND NOISE CHARACTERISTICS OF MEMORY CELLS simplified abstract
- Micron technology, inc. (20240185941). METHODS FOR RECOVERY FOR MEMORY SYSTEMS AND MEMORY SYSTEMS EMPLOYING THE SAME simplified abstract
- Micron technology, inc. (20240257892). PEAK POWER MANAGEMENT CONNECTIVITY CHECK IN A MEMORY DEVICE simplified abstract
- Micron Technology, Inc. patent applications on August 1st, 2024
- Micron Technology, Inc. patent applications on June 6th, 2024
- Micron Technology, Inc. patent applications on March 14th, 2024
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- Samsung electronics co., ltd. (20240312551). NONVOLATILE MEMORY PACKAGE, STORAGE DEVICE INCLUDING THE SAME, AND METHOD OF OPERATING THEREOF simplified abstract
- Samsung Electronics Co., Ltd. patent applications on September 19th, 2024
- SAMSUNG ELECTRONICS CO., LTD. patent applications on September 19th, 2024
- Sk hynix inc. (20240161851). TEST SYSTEMS CONFIGURED TO PERFORM TEST MODE OPERATIONS FOR MULTIPLE MEMORY DEVICES simplified abstract
- Sk hynix inc. (20250006291). TEST CIRCUIT AND SEMICONDUCTOR MEMORY SYSTEM INCLUDING THE TEST CIRCUIT
- SK hynix Inc. patent applications on January 2nd, 2025
- SK hynix Inc. patent applications on May 16th, 2024
