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Category:G11C16/32
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This category has the following 32 subcategories, out of 32 total.
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Pages in category "G11C16/32"
The following 148 pages are in this category, out of 148 total.
1
- 17819826. DETECTING A MEMORY WRITE RELIABILITY RISK WITHOUT USING A WRITE VERIFY OPERATION simplified abstract (Micron Technology, Inc.)
- 17831350. MEMORY BLOCK CHARACTERISTIC DETERMINATION simplified abstract (Micron Technology, Inc.)
- 17871358. NONVOLATILE MEMORY DEVICE simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 17874100. Non-Volatile Memory Power Cycle Protection Mechanism simplified abstract (Apple Inc.)
- 17875827. APPARATUS WITH CIRCUIT MANAGEMENT MECHANISM AND METHODS FOR OPERATING THE SAME simplified abstract (Micron Technology, Inc.)
- 17876346. MEMORY CELL VOLTAGE LEVEL SELECTION simplified abstract (Micron Technology, Inc.)
- 17888225. ADAPTIVE SENSING TIME FOR MEMORY OPERATIONS simplified abstract (Micron Technology, Inc.)
- 17898733. MEMORY DEVICE AND METHOD FOR OPERATING THE SAME simplified abstract (Taiwan Semiconductor Manufacturing Company, Ltd.)
- 17931935. SUSPENDING MEMORY ERASE OPERATIONS TO PERFORM HIGHER PRIORITY MEMORY COMMANDS simplified abstract (Micron Technology, Inc.)
- 17941831. ADAPTIVE PRE-READ MANAGEMENT IN MULTI-PASS PROGRAMMING simplified abstract (Micron Technology, Inc.)
- 17961048. SOLID STATE DRIVE (SSD) AND OPERATING METHOD simplified abstract (Samsung Electronics Co., Ltd.)
- 17972224. MEMORY DEVICE AND METHOD OF OPERATING THE SAME simplified abstract (SK hynix Inc.)
- 17973005. Memory system and memory access interface device thereof simplified abstract (REALTEK SEMICONDUCTOR CORPORATION)
- 18064002. STORAGE DEVICE AND STORAGE SYSTEM INCLUDING THE SAME simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 18148579. NONVOLATILE MEMORY DEVICE PROVIDING INPUT/OUTPUT COMPATIBILITY AND METHOD FOR SETTING COMPATIBILITY THEREOF simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 18228291. MEMORY DEVICE PRODUCING METADATA CHARACTERIZING APPLIED READ VOLTAGE LEVEL WITH RESPECT TO VOLTAGE DISTRIBUTIONS simplified abstract (Micron Technology, Inc.)
- 18239589. DATA FLIP-FLOP CIRCUIT OF NONVOLATILE MEMORY DEVICE AND NONVOLATILE MEMORY DEVICE INCLUDING THE SAME simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 18318725. MEMORY DEVICE AND METHOD OF OPERATING THE SAME simplified abstract (SK hynix Inc.)
- 18403944. SEMICONDUCTOR STORAGE DEVICE simplified abstract (Kioxia Corporation)
- 18429729. METHOD FOR TUNING AN EXTERNAL MEMORY INTERFACE simplified abstract (Texas Instruments Incorporated)
- 18436025. MEMORY SYSTEM AND OPERATING METHOD OF THE MEMORY SYSTEM simplified abstract (SK hynix Inc.)
- 18441331. NONVOLATILE MEMORY DEVICE AND OPERATING METHOD OF NONVOLATILE MEMORY DEVICE simplified abstract (Samsung Electronics Co., Ltd.)
- 18464383. METHOD OF PROGRAMMING DATA IN NONVOLATILE MEMORY DEVICE AND NONVOLATILE MEMORY DEVICE PERFORMING THE SAME simplified abstract (Samsung Electronics Co., Ltd.)
- 18467005. DATA PATH OSCILLATOR MISMATCH ERROR REDUCTION FOR NON-VOLATILE MEMORY (Western Digital Technologies, Inc.)
- 18489770. COMPACT DIGITAL THERMOMETER IN A MEMORY DEVICE simplified abstract (Micron Technology, Inc.)
- 18491966. NON-VOLATILE MEMORY DEVICE AND PROGRAMMING METHOD THEREOF simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 18505855. MEDIA MANAGEMENT SCANNING WITH UNIFIED CRITERIA TO ALLEVIATE FAST AND LATENT READ DISTURB simplified abstract (Micron Technology, Inc.)
- 18508479. STORAGE DEVICE AND STORAGE SYSTEM INCLUDING THE SAME simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 18524721. MANAGING ASYNCHRONOUS POWER LOSS IN A MEMORY DEVICE simplified abstract (Micron Technology, Inc.)
- 18528375. TRIM SETTING DETERMINATION ON A MEMORY DEVICE simplified abstract (Micron Technology, Inc.)
- 18539798. MULTI-SAMPLED, CHARGE-SHARING THERMOMETER IN MEMORY DEVICE simplified abstract (Micron Technology, Inc.)
- 18541839. CLOCK SIGNAL GENERATOR AND METHOD OF OPERATING THE SAME simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 18545888. ENHANCED GRADIENT SEEDING SCHEME DURING A PROGRAM OPERATION IN A MEMORY SUB-SYSTEM simplified abstract (Micron Technology, Inc.)
- 18589263. STORAGE CONTROLLER, STORAGE DEVICE INCLUDING THE SAME, AND OPERATION METHOD OF STORAGE CONTROLLER simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 18595909. MEMORY DEVICE AND OPERATION THEREOF simplified abstract (Yangtze Memory Technologies Co., Ltd.)
- 18599471. MEMORY DEVICE AND METHOD OF OPERATING WORDLINES simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 18659845. MEMORY BLOCK CHARACTERISTIC DETERMINATION simplified abstract (Micron Technology, Inc.)
- 18662238. SEMICONDUCTOR MEMORY simplified abstract (KIOXIA CORPORATION)
- 18666063. PROGRAMMING DELAY SCHEME FOR IN A MEMORY SUB-SYSTEM BASED ON MEMORY RELIABILITY simplified abstract (Micron Technology, Inc.)
- 18672202. SEMICONDUCTOR DEVICE simplified abstract (Kioxia Corporation)
- 18677727. MEMORY SYSTEM, CONTROL METHOD THEREOF, AND PROGRAM simplified abstract (Kioxia Corporation)
- 18774642. ENHANCING READ WINDOW BUDGET USING READ VERIFY (Micron Technology, Inc.)
- 18796585. NON-VOLATILE MEMORY DEVICE AND A METHOD OF OPERATING THE SAME (SAMSUNG ELECTRONICS CO., LTD.)
- 18804617. MEMORY DEVICE, MEMORY SYSTEM, AND OPERATING METHOD OF MEMORY DEVICE (SAMSUNG ELECTRONICS CO., LTD.)
- 18814030. MEMORY DEVICE FOR PROGRAM DISTURBANCE SUPPRESSION AND PROGRAMMING METHOD THEREOF (SAMSUNG ELECTRONICS CO., LTD.)
- 18818527. SEMICONDUCTOR STORAGE DEVICE (Kioxia Corporation)
- 18820480. DETECTING A MEMORY WRITE RELIABILITY RISK WITHOUT USING A WRITE VERIFY OPERATION (Micron Technology, Inc.)
- 18932736. MEMORY DEVICE, MEMORY SYSTEM, AND OPERATING METHOD OF MEMORY DEVICE (SAMSUNG ELECTRONICS CO., LTD.)
- 18937365. WRITE PERFORMANCE OPTIMIZATION FOR ERASE ON DEMAND (Micron Technology, Inc.)
- 18946968. SEMICONDUCTOR MEMORY DEVICE (Kioxia Corporation)
- 18948283. COLUMN CONTROL CIRCUITS AND STORAGE DEVICES (CXMT CORPORATION)
- 18956073. SEMICONDUCTOR STORAGE DEVICE (Kioxia Corporation)
- 18960407. VARIABLE NAND MODE WITH SINGLE PLL SOURCE (Micron Technology, Inc.)
- 18964133. SEMICONDUCTOR MEMORY DEVICE (Kioxia Corporation)
- 18967011. DYNAMIC STEP VOLTAGE LEVEL ADJUSTMENT (Micron Technology, Inc.)
- 18971520. MEMORY CELL VOLTAGE LEVEL SELECTION (Micron Technology, Inc.)
- 18973880. WORDLINE OR PILLAR STATE DETECTION FOR FASTER READ ACCESS TIMES (Micron Technology, Inc.)
- 18975937. ADAPTIVE BITLINE VOLTAGE FOR MEMORY OPERATIONS (Micron Technology, Inc.)
C
K
- Kioxia corporation (20240296895). SEMICONDUCTOR MEMORY simplified abstract
- Kioxia corporation (20240312532). SEMICONDUCTOR DEVICE simplified abstract
- Kioxia corporation (20240312533). MEMORY SYSTEM, CONTROL METHOD THEREOF, AND PROGRAM simplified abstract
- Kioxia corporation (20240420765). SEMICONDUCTOR STORAGE DEVICE
- Kioxia corporation (20250095741). SEMICONDUCTOR MEMORY DEVICE
- Kioxia Corporation patent applications on December 19th, 2024
- Kioxia Corporation patent applications on March 20th, 2025
- Kioxia Corporation patent applications on September 19th, 2024
- KIOXIA CORPORATION patent applications on September 5th, 2024
M
- Micron technology, inc. (20240127900). PERFORMING SELECTIVE COPYBACK IN MEMORY DEVICES simplified abstract
- Micron technology, inc. (20240161838). MEDIA MANAGEMENT SCANNING WITH UNIFIED CRITERIA TO ALLEVIATE FAST AND LATENT READ DISTURB simplified abstract
- Micron technology, inc. (20240194279). MANAGING ASYNCHRONOUS POWER LOSS IN A MEMORY DEVICE simplified abstract
- Micron technology, inc. (20240203508). SELECTIVE MANAGEMENT OF ERASE OPERATIONS IN MEMORY DEVICES THAT ENABLE SUSPEND COMMANDS simplified abstract
- Micron technology, inc. (20240203516). SELECTABLE TRIM SETTINGS ON A MEMORY DEVICE simplified abstract
- Micron technology, inc. (20240233839). COMPACT DIGITAL THERMOMETER IN A MEMORY DEVICE simplified abstract
- Micron technology, inc. (20240290392). DECK-BASED ERASE FUNCTION simplified abstract
- Micron technology, inc. (20240296892). MEMORY BLOCK CHARACTERISTIC DETERMINATION simplified abstract
- Micron technology, inc. (20240304256). PROGRAMMING DELAY SCHEME FOR IN A MEMORY SUB-SYSTEM BASED ON MEMORY RELIABILITY simplified abstract
- Micron technology, inc. (20240312526). PARTIAL BLOCK HANDLING PROTOCOL IN A NON-VOLATILE MEMORY DEVICE simplified abstract
- Micron technology, inc. (20240420783). DETECTING A MEMORY WRITE RELIABILITY RISK WITHOUT USING A WRITE VERIFY OPERATION
- Micron technology, inc. (20250069669). WRITE PERFORMANCE OPTIMIZATION FOR ERASE ON DEMAND
- Micron technology, inc. (20250069675). ENHANCING READ WINDOW BUDGET USING READ VERIFY
- Micron technology, inc. (20250085889). VARIABLE NAND MODE WITH SINGLE PLL SOURCE
- Micron technology, inc. (20250095746). DYNAMIC STEP VOLTAGE LEVEL ADJUSTMENT
- Micron technology, inc. (20250103215). ADAPTIVE BITLINE VOLTAGE FOR MEMORY OPERATIONS
- Micron technology, inc. (20250104772). MEMORY CELL VOLTAGE LEVEL SELECTION
- Micron technology, inc. (20250104781). WORDLINE OR PILLAR STATE DETECTION FOR FASTER READ ACCESS TIMES
- Micron Technology, Inc. patent applications on April 18th, 2024
- Micron Technology, Inc. patent applications on August 29th, 2024
- Micron Technology, Inc. patent applications on December 19th, 2024
- Micron Technology, Inc. patent applications on February 15th, 2024
- Micron Technology, Inc. patent applications on February 1st, 2024
- Micron Technology, Inc. patent applications on February 27th, 2025
- Micron Technology, Inc. patent applications on February 29th, 2024
- Micron Technology, Inc. patent applications on January 23rd, 2025
- Micron Technology, Inc. patent applications on July 11th, 2024
- Micron Technology, Inc. patent applications on June 13th, 2024
- Micron Technology, Inc. patent applications on June 20th, 2024
- Micron Technology, Inc. patent applications on March 13th, 2025
- Micron Technology, Inc. patent applications on March 14th, 2024
- Micron Technology, Inc. patent applications on March 20th, 2025
- Micron Technology, Inc. patent applications on March 27th, 2025
- Micron Technology, Inc. patent applications on May 16th, 2024
- Micron Technology, Inc. patent applications on September 12th, 2024
- Micron Technology, Inc. patent applications on September 19th, 2024
- Micron Technology, Inc. patent applications on September 5th, 2024
S
- Samsung electronics co., ltd. (20240201774). STORAGE CONTROLLER, STORAGE DEVICE INCLUDING THE SAME, AND OPERATION METHOD OF STORAGE CONTROLLER simplified abstract
- Samsung electronics co., ltd. (20240204760). DATA FLIP-FLOP CIRCUIT OF NONVOLATILE MEMORY DEVICE AND NONVOLATILE MEMORY DEVICE INCLUDING THE SAME simplified abstract
- Samsung electronics co., ltd. (20240212761). METHOD OF PROGRAMMING DATA IN NONVOLATILE MEMORY DEVICE AND NONVOLATILE MEMORY DEVICE PERFORMING THE SAME simplified abstract
- Samsung electronics co., ltd. (20240249781). CLOCK SIGNAL GENERATOR AND METHOD OF OPERATING THE SAME simplified abstract
- Samsung electronics co., ltd. (20240282377). NONVOLATILE MEMORY DEVICE AND OPERATING METHOD OF NONVOLATILE MEMORY DEVICE simplified abstract
- Samsung electronics co., ltd. (20240312540). MEMORY DEVICE AND METHOD OF OPERATING WORDLINES simplified abstract
- Samsung electronics co., ltd. (20240329886). MEMORY DEVICE INCLUDING INTERFACE CIRCUIT AND METHOD OF OPERATING THE SAME simplified abstract
- Samsung electronics co., ltd. (20250021129). STORAGE DEVICE AND STORAGE SYSTEM INCLUDING THE SAME
- Samsung electronics co., ltd. (20250069668). MEMORY DEVICE FOR PROGRAM DISTURBANCE SUPPRESSION AND PROGRAMMING METHOD THEREOF
- Samsung electronics co., ltd. (20250095754). MEMORY DEVICE, MEMORY SYSTEM, AND OPERATING METHOD OF MEMORY DEVICE
- Samsung electronics co., ltd. (20250095755). MEMORY DEVICE, MEMORY SYSTEM, AND OPERATING METHOD OF MEMORY DEVICE
- Samsung electronics co., ltd. (20250095759). NON-VOLATILE MEMORY DEVICE AND A METHOD OF OPERATING THE SAME
- Samsung Electronics Co., Ltd. patent applications on August 22nd, 2024
- Samsung Electronics Co., Ltd. patent applications on February 27th, 2025
- SAMSUNG ELECTRONICS CO., LTD. patent applications on February 27th, 2025
- SAMSUNG ELECTRONICS CO., LTD. patent applications on February 8th, 2024
- Samsung Electronics Co., Ltd. patent applications on January 16th, 2025
- Samsung Electronics Co., Ltd. patent applications on July 25th, 2024
- SAMSUNG ELECTRONICS CO., LTD. patent applications on July 25th, 2024
- Samsung Electronics Co., Ltd. patent applications on June 20th, 2024
- SAMSUNG ELECTRONICS CO., LTD. patent applications on June 20th, 2024
- Samsung Electronics Co., Ltd. patent applications on June 27th, 2024
- SAMSUNG ELECTRONICS CO., LTD. patent applications on March 14th, 2024
- Samsung Electronics Co., Ltd. patent applications on March 20th, 2025
- SAMSUNG ELECTRONICS CO., LTD. patent applications on March 20th, 2025
- Samsung Electronics Co., Ltd. patent applications on October 3rd, 2024
- Samsung Electronics Co., Ltd. patent applications on September 19th, 2024
- SAMSUNG ELECTRONICS CO., LTD. patent applications on September 19th, 2024
- Sk hynix inc. (20240177754). MEMORY SYSTEM AND OPERATING METHOD OF THE MEMORY SYSTEM simplified abstract
- Sk hynix inc. (20240177785). MEMORY DEVICE AND METHOD OF OPERATING THE SAME simplified abstract
- Sk hynix inc. (20240265971). MEMORY DEVICE CONTROLLING PASS VOLTAGE AND OPERATING METHOD THEREOF simplified abstract
- SK hynix Inc. patent applications on August 8th, 2024
- SK hynix Inc. patent applications on February 13th, 2025
- SK hynix Inc. patent applications on January 18th, 2024
- SK hynix Inc. patent applications on May 30th, 2024
U
- US Patent Application 17752590. ADAPTIVE POROGRAMMING DELAY SCHEME IN A MEMORY SUB-SYSTEM simplified abstract
- US Patent Application 17824350. METHOD TO OPTIMIZE FIRST READ VERSUS SECOND READ MARGIN BY SWITCHING BOOST TIMING simplified abstract
- US Patent Application 17825439. PARTIAL BLOCK HANDLING PROTOCOL IN A NON-VOLATILE MEMORY DEVICE simplified abstract
- US Patent Application 17827562. SYSTEMS AND METHODS OF CORRECTING ERRORS IN UNMATCHED MEMORY DEVICES simplified abstract