There is currently no text in this page. You can search for this page title in other pages, or search the related logs, but you do not have permission to create this page.
Category:G06F11/273
Subcategories
This category has the following 4 subcategories, out of 4 total.
J
M
R
Pages in category "G06F11/273"
The following 30 pages are in this category, out of 30 total.
1
- 17551482. TESTING OF HARDWARE QUEUE SYSTEMS USING ON DEVICE TEST GENERATION simplified abstract (INTERNATIONAL BUSINESS MACHINES CORPORATION)
- 17988011. Optimization of Process for Exiting Machines from Test Environments simplified abstract (INTERNATIONAL BUSINESS MACHINES CORPORATION)
- 18129394. CXL PROTOCOL ENABLEMENT FOR TEST ENVIRONMENT SYSTEMS AND METHODS simplified abstract (ADVANTEST CORPORATION)
- 18129422. SYSTEMS AND METHODS UTILIZING DAX MEMORY MANAGEMENT FOR TESTING CXL PROTOCOL ENABLED DEVICES simplified abstract (ADVANTEST CORPORATION)
- 18223627. INTELLIGENT SCORE BASED OOM TEST BASELINE MECHANISM simplified abstract (Dell Products L.P.)
- 18243421. DEBUG FOR MULTI-THREADED PROCESSING simplified abstract (Texas Instruments Incorporated)
- 18301842. MEMORY TEST DRIVE simplified abstract (Samsung Electronics Co., Ltd.)
- 18441746. MEMORY APPARATUS, TEST FIXTURE, AND TEST SYSTEM (Yangtze Memory Technologies Co., Ltd.)
- 18442704. POWER SAVING BY LOADING REPAIR INFORMATION BEFORE MEMORY DEVICE SENSING simplified abstract (Micron Technology, Inc.)
- 18464913. SIGNAL TRANSFER CONTROL METHOD, SIGNAL TRANSFER APPARATUS, AND TEST SYSTEM AND PLATFORM simplified abstract (Huawei Technologies Co., Ltd.)
- 18744322. PROGRAMMABLE TEST COMPRESSION ARCHITECTURE INPUT/OUTPUT SHIFT REGISTER simplified abstract (Texas Instruments Incorporated)
- 18815553. LEVERAGING LOW POWER STATES FOR FAULT TESTING OF PROCESSING CORES AT RUNTIME (NVIDIA Corporation)
- 19004138. TEST MODE STATE MACHINE FOR A MEMORY DEVICE (Micron Technology, Inc.)
D
I
- Intel corporation (20240354211). APPARATUS, SYSTEM, AND METHOD OF DEBUGGING simplified abstract
- Intel Corporation patent applications on October 24th, 2024
- International business machines corporation (20240160546). Optimization of Process for Exiting Machines from Test Environments simplified abstract
- INTERNATIONAL BUSINESS MACHINES CORPORATION patent applications on May 16th, 2024
M
- Micron technology, inc. (20240281351). POWER SAVING BY LOADING REPAIR INFORMATION BEFORE MEMORY DEVICE SENSING simplified abstract
- Micron technology, inc. (20250138744). TEST MODE STATE MACHINE FOR A MEMORY DEVICE
- Micron Technology, Inc. patent applications on August 22nd, 2024
- Micron Technology, Inc. patent applications on May 1st, 2025