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Category:G01R31/3185
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This category has the following 21 subcategories, out of 21 total.
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Pages in category "G01R31/3185"
The following 101 pages are in this category, out of 101 total.
1
- 17849945. SEMICONDUCTOR INTEGRATED CIRCUIT, A METHOD FOR TESTING THE SEMICONDUCTOR INTEGRATED CIRCUIT, AND A SEMICONDUCTOR SYSTEM simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 17859870. SYSTEM ON CHIP FOR PERFORMING SCAN TEST AND METHOD OF DESIGNING THE SAME simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 17932808. FLEXIBLE ONE-HOT DECODING LOGIC FOR CLOCK CONTROLS simplified abstract (NVIDIA Corporation)
- 18124338. MEMORY TIMING CHARACTERIZATION CIRCUITRY simplified abstract (Intel Corporation)
- 18152017. BI-DIRECTIONAL SCAN FLIP-FLOP CIRCUIT AND METHOD simplified abstract (Taiwan Semiconductor Manufacturing Co., Ltd.)
- 18177809. TEST SYSTEM, TEST METHOD, AND NON-TRANSITORY COMPUTER READABLE MEDIUM simplified abstract (Kioxia Corporation)
- 18179593. HIGH THROUGHPUT SORT simplified abstract (Infineon Technologies AG)
- 18190144. SEMICONDUCTOR CHIP AND SEQUENCE CHECKING CIRCUIT simplified abstract (TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.)
- 18202671. LOW POWER MULTIBIT FLIP-FLOP FOR STANDARD CELL LIBRARY simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 18244994. DYNAMIC VOLTAGE FREQUENCY SCALING TO REDUCE TEST TIME simplified abstract (MEDIATEK INC.)
- 18335804. Diagnostic Device (The Boeing Company)
- 18338471. ELECTRONIC DEVICE AND METHOD OF TESTING ELECTRONIC DEVICE simplified abstract (Samsung Electronics Co., Ltd.)
- 18350512. DESIGN-FOR-TEST CIRCUITS AND METHODS OF OPERATING THE SAME simplified abstract (Taiwan Semiconductor Manufacturing Company, Ltd.)
- 18368195. 3D TAP & SCAN PORT ARCHITECTURES simplified abstract (Texas Instruments Incorporated)
- 18377777. LOW POWER FLIP-FLOP simplified abstract (Samsung Electronics Co., Ltd.)
- 18391145. Scan Data Transfer Circuits for Multi-die Chip Testing (Apple Inc.)
- 18392740. AT-SPEED TEST OF FUNCTIONAL MEMORY INTERFACE LOGIC IN DEVICES simplified abstract (Texas Instruments Incorporated)
- 18403623. SCAN ARCHITECTURE FOR INTERCONNECT TESTING IN 3D INTEGRATED CIRCUITS simplified abstract (Taiwan Semiconductor Manufacturing Company, Ltd.)
- 18406067. SAVING AND RESTORING SCAN STATES simplified abstract (Atmosic Technologies, Inc.)
- 18471624. WAFER LEVEL METHODS OF TESTING SEMICONDUCTOR DEVICES USING INTERNALLY-GENERATED TEST ENABLE SIGNALS simplified abstract (Samsung Electronics Co., Ltd.)
- 18499743. APPARATUSES AND METHODS FOR FACILIATATING A DYNAMIC CLOCK FREQUENCY FOR AT-SPEED TESTING (NXP B.V.)
- 18507879. SECURE BOOT APPARATUS AND METHOD simplified abstract (Huawei Technologies Co., Ltd.)
- 18512792. SYSTEMS AND METHODS TO DETECT CELL-INTERNAL DEFECTS simplified abstract (Taiwan Semiconductor Manufacturing Company, Ltd.)
- 18524900. INTERPOSER CIRCUIT simplified abstract (TEXAS INSTRUMENTS INCORPORATED)
- 18526497. TSV TESTING simplified abstract (TEXAS INSTRUMENTS INCORPORATED)
- 18551879. Processing Devices for reducing scan traffic, Method and Computer Program simplified abstract (Intel Corporation)
- 18588819. DATA INTEGRITY CHECKING simplified abstract (Imagination Technologies Limited)
- 18597215. HOLD TIME IMPROVED LOW AREA FLIP-FLOP ARCHITECTURE simplified abstract (Texas Instruments Incorporated)
- 18624070. SINGLE "A" LATCH WITH AN ARRAY OF "B" LATCHES simplified abstract (SambaNova Systems, Inc.)
- 18734226. 3D STACKED DIE TEST ARCHITECTURE simplified abstract (Texas Instruments Incorporated)
- 18744322. PROGRAMMABLE TEST COMPRESSION ARCHITECTURE INPUT/OUTPUT SHIFT REGISTER simplified abstract (Texas Instruments Incorporated)
- 18746853. Configurable Storage Circuits And Methods simplified abstract (Intel Corporation)
- 18828799. MERGED PARAMETRIC SCAN TOPOLOGY (TEXAS INSTRUMENTS INCORPORATED)
- 18956271. SCAN TESTABLE THROUGH SILICON VIAS (TEXAS INSTRUMENTS INCORPORATED)
- 18956830. COMMANDED JTAG TEST ACCESS PORT OPERATIONS (TEXAS INSTRUMENTS INCORPORATED)
- 18968627. BI-DIRECTIONAL SCAN FLIP-FLOP CIRCUIT AND METHOD (Taiwan Semiconductor Manufacturing Co., Ltd.)
- 18968883. THROUGH-SILICON VIA (TSV) TESTING (Texas Instruments Incorporated)
A
H
- Huawei technologies co., ltd. (20240095366). SECURE BOOT APPARATUS AND METHOD simplified abstract
- Huawei technologies co., ltd. (20240125850). Automatic Test Pattern Generation-Based Circuit Verification Method and Apparatus simplified abstract
- HUAWEI TECHNOLOGIES CO., LTD. patent applications on April 18th, 2024
- Huawei Technologies Co., Ltd. patent applications on March 21st, 2024
I
- Intel corporation (20240103077). METHOD AND APPARATUS FOR ACCESSING REMOTE TEST DATA REGISTERS simplified abstract
- Intel corporation (20240103079). INFIELD PERIODIC DEVICE TESTING WHILE MAINTAINING HOST CONNECTIVITY simplified abstract
- Intel corporation (20240159829). Processing Devices for reducing scan traffic, Method and Computer Program simplified abstract
- Intel corporation (20240264231). TECHNIQUES FOR INFIELD TESTING OF CRYPTOGRAPHIC CIRCUITRY simplified abstract
- Intel corporation (20240319269). MEMORY TIMING CHARACTERIZATION CIRCUITRY simplified abstract
- Intel corporation (20240337692). Configurable Storage Circuits And Methods simplified abstract
- Intel Corporation patent applications on August 8th, 2024
- Intel Corporation patent applications on March 28th, 2024
- Intel Corporation patent applications on May 16th, 2024
- Intel Corporation patent applications on October 10th, 2024
- Intel Corporation patent applications on September 26th, 2024
M
- Micron technology, inc. (20240125851). MULTI-MODAL MEMORY APPARATUSES AND SYSTEMS simplified abstract
- Micron technology, inc. (20240288497). SYSTEM ACCESS BOUNDARY SCAN VIA SYSTEM SIDEBAND SIGNAL CONNECTIONS simplified abstract
- Micron Technology, Inc. patent applications on April 18th, 2024
- Micron Technology, Inc. patent applications on August 29th, 2024
N
S
- Samsung electronics co., ltd. (20240128952). LOW POWER FLIP-FLOP simplified abstract
- Samsung electronics co., ltd. (20240210471). ELECTRONIC DEVICE AND METHOD OF TESTING ELECTRONIC DEVICE simplified abstract
- Samsung electronics co., ltd. (20240339992). LOW POWER MULTIBIT FLIP-FLOP FOR STANDARD CELL LIBRARY simplified abstract
- Samsung electronics co., ltd. (20240353486). STORAGE SYSTEM AND AN OPERATING METHOD THEREOF simplified abstract
- Samsung Electronics Co., Ltd. patent applications on April 18th, 2024
- Samsung Electronics Co., Ltd. patent applications on January 23rd, 2025
- SAMSUNG ELECTRONICS CO., LTD. patent applications on January 23rd, 2025
- Samsung Electronics Co., Ltd. patent applications on June 27th, 2024
- Samsung Electronics Co., Ltd. patent applications on October 10th, 2024
- SAMSUNG ELECTRONICS CO., LTD. patent applications on October 10th, 2024
- Samsung Electronics Co., Ltd. patent applications on October 24th, 2024
T
- Taiwan semiconductor manufacturing co., ltd. (20240097661). BI-DIRECTIONAL SCAN FLIP-FLOP CIRCUIT AND METHOD simplified abstract
- Taiwan semiconductor manufacturing co., ltd. (20250096783). BI-DIRECTIONAL SCAN FLIP-FLOP CIRCUIT AND METHOD
- Taiwan Semiconductor Manufacturing Co., Ltd. patent applications on March 20th, 2025
- Taiwan Semiconductor Manufacturing Co., Ltd. patent applications on March 21st, 2024
- Taiwan semiconductor manufacturing company, ltd. (20240295603). DESIGN-FOR-TEST CIRCUITS AND METHODS OF OPERATING THE SAME simplified abstract
- Taiwan Semiconductor Manufacturing Company, Ltd. patent applications on April 25th, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd. patent applications on March 14th, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd. patent applications on September 5th, 2024
- Texas instruments incorporated (20240319274). 3D STACKED DIE TEST ARCHITECTURE simplified abstract
- Texas instruments incorporated (20240337691). PROGRAMMABLE TEST COMPRESSION ARCHITECTURE INPUT/OUTPUT SHIFT REGISTER simplified abstract
- Texas instruments incorporated (20240345154). INTEGRATED CIRCUIT DIE TEST ARCHITECTURE simplified abstract
- Texas instruments incorporated (20250085343). COMMANDED JTAG TEST ACCESS PORT OPERATIONS
- Texas instruments incorporated (20250085346). MERGED PARAMETRIC SCAN TOPOLOGY
- Texas instruments incorporated (20250087539). SCAN TESTABLE THROUGH SILICON VIAS
- Texas instruments incorporated (20250093404). THROUGH-SILICON VIA (TSV) TESTING
- TEXAS INSTRUMENTS INCORPORATED patent applications on January 23rd, 2025
- TEXAS INSTRUMENTS INCORPORATED patent applications on March 13th, 2025
- Texas Instruments Incorporated patent applications on March 20th, 2025
- Texas Instruments Incorporated patent applications on October 10th, 2024
- TEXAS INSTRUMENTS INCORPORATED patent applications on October 17th, 2024
- Texas Instruments Incorporated patent applications on September 26th, 2024
- The boeing company (20240418773). Diagnostic Device
- The Boeing Company patent applications on December 19th, 2024
U
- US Patent Application 17827834. ELECTRONIC CIRCUIT AND METHOD OF ERROR CORRECTION simplified abstract
- US Patent Application 18234003. SCAN TESTING USING SCAN FRAMES WITH EMBEDDED COMMANDS simplified abstract
- US Patent Application 18303401. Built-in Self-Test for Die-to-Die Physical Interfaces simplified abstract
- US Patent Application 18366981. Flip Flop Circuit simplified abstract
