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Category:G01R31/317
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Pages in category "G01R31/317"
The following 156 pages are in this category, out of 156 total.
1
- 17662327. INTEGRATED CIRCUIT AND AN ELECTRONIC DEVICE INCLUDING INTEGRATED CIRCUIT simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 17773132. DETECTION METHOD AND APPARATUS FOR LINK, ELECTRONIC DEVICE AND COMPUTER-READABLE MEDIUM simplified abstract (ZTE CORPORATION)
- 17849945. SEMICONDUCTOR INTEGRATED CIRCUIT, A METHOD FOR TESTING THE SEMICONDUCTOR INTEGRATED CIRCUIT, AND A SEMICONDUCTOR SYSTEM simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 17851860. TEST CIRCUIT USING CLOCK GATING SCHEME TO HOLD CAPTURE PROCEDURE AND BYPASS MODE, AND INTEGRATED CIRCUIT INCLUDING THE SAME simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 17859870. SYSTEM ON CHIP FOR PERFORMING SCAN TEST AND METHOD OF DESIGNING THE SAME simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 17895826. SYSTEMS AND TECHNIQUES FOR TIMING MISMATCH REDUCTION simplified abstract (Micron Technology, Inc.)
- 17932808. FLEXIBLE ONE-HOT DECODING LOGIC FOR CLOCK CONTROLS simplified abstract (NVIDIA Corporation)
- 17958071. Secure Remote Debugging simplified abstract (Intel Corporation)
- 17988507. COMPETING PATH RING-OSCILLATOR FOR DIRECT MEASUREMENT OF A LATCH TIMING WINDOW PARAMETERS simplified abstract (INTERNATIONAL BUSINESS MACHINES CORPORATION)
- 17988989. SYSTEM AND METHOD OF MONITORING PERFORMANCE OF AN ELECTRONIC DEVICE simplified abstract (Samsung Electronics Co., Ltd.)
- 18091060. TECHNIQUES FOR DEBUG, SURVIVABILITY, AND INFIELD TESTING OF A SYSTEM-ON-A-CHIP OR A SYSTEM-ON-A-PACKAGE simplified abstract (Intel Corporation)
- 18124338. MEMORY TIMING CHARACTERIZATION CIRCUITRY simplified abstract (Intel Corporation)
- 18158181. TRAINING METHOD AND TEST APPARATUS USING THE SAME simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 18171951. Low-Frequency Oscillator Monitoring Circuit simplified abstract (Texas Instruments Incorporated)
- 18174647. TEST MODE CONTROL CIRCUIT, SEMICONDUCTOR APPARATUS AND SYSTEM, AND METHOD THEREOF simplified abstract (SK hynix Inc.)
- 18177809. TEST SYSTEM, TEST METHOD, AND NON-TRANSITORY COMPUTER READABLE MEDIUM simplified abstract (Kioxia Corporation)
- 18179593. HIGH THROUGHPUT SORT simplified abstract (Infineon Technologies AG)
- 18189859. BUILT-IN SELF-TEST ENHANCEMENTS simplified abstract (QUALCOMM Incorporated)
- 18203024. JITTER MEASURING CIRCUIT, JITTER ANALYZING APPARATUS INCLUDING THE SAME, AND RELATED METHODS OF MANUFACTURING SEMICONDUCTOR DEVICES simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 18218479. FULLY DIGITAL DOMAIN INTEGRATED FREQUENCY MONITOR (NVIDIA Corporation)
- 18219484. METHODS FOR DETERMINING AND CALIBRATING NON-LINEARITY IN A PHASE INTERPOLATOR AND RELATED DEVICES AND SYSTEMS simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 18229965. LOW POWER ENVIRONMENT FOR HIGH PERFORMANCE PROCESSOR WITHOUT LOW POWER MODE simplified abstract (ADVANTEST CORPORATION)
- 18232341. NOVEL JITTER NOISE DETECTOR simplified abstract (Taiwan Semiconductor Manufacturing Co., Ltd.)
- 18295493. LOW POWER AND AREA CLOCK MONITORING CIRCUIT USING RING DELAY ARRANGEMENT simplified abstract (NVIDIA Corporation)
- 18350512. DESIGN-FOR-TEST CIRCUITS AND METHODS OF OPERATING THE SAME simplified abstract (Taiwan Semiconductor Manufacturing Company, Ltd.)
- 18355177. SYSTEM, METHOD FOR CIRCUIT VALIDATION, AND SYSTEM AND METHOD FOR FACILITATING CIRCUIT VALIDATION simplified abstract (SK hynix Inc.)
- 18368195. 3D TAP & SCAN PORT ARCHITECTURES simplified abstract (Texas Instruments Incorporated)
- 18379686. Test device for testing on-chip clock controller having debug function simplified abstract (REALTEK SEMICONDUCTOR CORPORATION)
- 18391145. Scan Data Transfer Circuits for Multi-die Chip Testing (Apple Inc.)
- 18395864. Oscillator And Electronic Device simplified abstract (SEIKO EPSON CORPORATION)
- 18403623. SCAN ARCHITECTURE FOR INTERCONNECT TESTING IN 3D INTEGRATED CIRCUITS simplified abstract (Taiwan Semiconductor Manufacturing Company, Ltd.)
- 18447955. FLIP FLOP STANDARD CELL simplified abstract (Taiwan Semiconductor Manufacturing Company, Ltd.)
- 18459130. DETERMINATION DEVICE, TEST SYSTEM, AND GENERATION DEVICE simplified abstract (Kioxia Corporation)
- 18463730. MEMORY, MEMORY SYSTEM AND METHOD OF CONTROLLING STORAGE DEVICE simplified abstract (Kioxia Corporation)
- 18471624. WAFER LEVEL METHODS OF TESTING SEMICONDUCTOR DEVICES USING INTERNALLY-GENERATED TEST ENABLE SIGNALS simplified abstract (Samsung Electronics Co., Ltd.)
- 18474217. SENSOR MODULE simplified abstract (SEIKO EPSON CORPORATION)
- 18499743. APPARATUSES AND METHODS FOR FACILIATATING A DYNAMIC CLOCK FREQUENCY FOR AT-SPEED TESTING (NXP B.V.)
- 18506435. METHOD, DEVICE, AND SYSTEM FOR DETECTING FUSE CONFIGURATION FOR TRIMMING CIRCUIT simplified abstract (Samsung Electronics Co., Ltd.)
- 18518629. CIRCUIT SCREENING SYSTEM AND CIRCUIT SCREENING METHOD simplified abstract (TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD.)
- 18521432. METHOD OF TESTING AN INTEGRATED CIRCUIT AND TESTING SYSTEM simplified abstract (Taiwan Semiconductor Manufacturing Co., Ltd.)
- 18523269. CLOCK MONITORING CIRCUIT simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 18524900. INTERPOSER CIRCUIT simplified abstract (TEXAS INSTRUMENTS INCORPORATED)
- 18529919. DISPLAY DEVICE, PANEL DEFECT DETECTION CIRCUIT AND PANEL DEFECT DETECTION METHOD simplified abstract (LG Display Co., Ltd.)
- 18532340. SEMICONDUCTOR CHIP AND SEMICONDUCTOR PACKAGE INCLUDING THE SAME simplified abstract (Samsung Electronics Co., Ltd.)
- 18532863. FUNCTIONAL TESTING DEVICE (Inventec (Pudong) Technology Corporation)
- 18532863. FUNCTIONAL TESTING DEVICE (INVENTEC CORPORATION)
- 18588819. DATA INTEGRITY CHECKING simplified abstract (Imagination Technologies Limited)
- 18597499. BUILT-IN SELF TEST CIRCUIT FOR MEASURING PERFORMANCE OF CLOCK DATA RECOVERY AND SYSTEM-ON-CHIP INCLUDING THE SAME simplified abstract (Samsung Electronics Co., Ltd.)
- 18607596. INTEGRATED CIRCUIT simplified abstract (LAPIS Technology Co., Ltd.)
- 18624070. SINGLE "A" LATCH WITH AN ARRAY OF "B" LATCHES simplified abstract (SambaNova Systems, Inc.)
- 18734226. 3D STACKED DIE TEST ARCHITECTURE simplified abstract (Texas Instruments Incorporated)
- 18744322. PROGRAMMABLE TEST COMPRESSION ARCHITECTURE INPUT/OUTPUT SHIFT REGISTER simplified abstract (Texas Instruments Incorporated)
- 18814460. TEST APPARATUS AND TEST METHOD (Kioxia Corporation)
2
- 20240012048. IP CORE TESTING APPARATUS simplified abstract (Infineon Technologies AG)
- 20240044973. Detecting a Function Section in a Representation of a Quantum Circuit simplified abstract (Classiq Technologies LTD.)
- 20240044978. METHODS FOR DETERMINING AND CALIBRATING NON-LINEARITY IN A PHASE INTERPOLATOR AND RELATED DEVICES AND SYSTEMS simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
A
- Apple inc. (20240103074). Functional Circuit Block Harvesting in Computer Systems simplified abstract
- Apple inc. (20250077384). Debug Trace Fabric for Integrated Circuit
- Apple inc. (20250093416). Scan Data Transfer Circuits for Multi-die Chip Testing
- Apple Inc. patent applications on March 20th, 2025
- Apple Inc. patent applications on March 28th, 2024
- Apple Inc. patent applications on March 6th, 2025
B
C
I
- Intel corporation (20240110975). Secure Remote Debugging simplified abstract
- Intel corporation (20240219462). TECHNIQUES FOR DEBUG, SURVIVABILITY, AND INFIELD TESTING OF A SYSTEM-ON-A-CHIP OR A SYSTEM-ON-A-PACKAGE simplified abstract
- Intel corporation (20240264231). TECHNIQUES FOR INFIELD TESTING OF CRYPTOGRAPHIC CIRCUITRY simplified abstract
- Intel corporation (20240319269). MEMORY TIMING CHARACTERIZATION CIRCUITRY simplified abstract
- Intel corporation (20240329129). TECHNOLOGIES FOR A UNIFIED TEST AND DEBUG ARCHITECTURE simplified abstract
- Intel Corporation patent applications on April 4th, 2024
- Intel Corporation patent applications on August 8th, 2024
- Intel Corporation patent applications on February 13th, 2025
- Intel Corporation patent applications on July 4th, 2024
- Intel Corporation patent applications on October 3rd, 2024
- Intel Corporation patent applications on September 26th, 2024
- International business machines corporation (20240162895). COMPETING PATH RING-OSCILLATOR FOR DIRECT MEASUREMENT OF A LATCH TIMING WINDOW PARAMETERS simplified abstract
- International Business Machines Corporation patent applications on March 6th, 2025
- INTERNATIONAL BUSINESS MACHINES CORPORATION patent applications on May 16th, 2024
K
L
M
- Meta platforms technologies, llc (20240288494). ACCURATE CLOCK CALIBRATION FOR DIE-TO-DIE (D2D) INTERFACES simplified abstract
- Meta platforms technologies, llc (20240288831). ACCURATE CLOCK EDGE CALIBRATION OVER PVT CORNERS simplified abstract
- Meta Platforms Technologies, LLC patent applications on August 29th, 2024
- Micron technology, inc. (20240288497). SYSTEM ACCESS BOUNDARY SCAN VIA SYSTEM SIDEBAND SIGNAL CONNECTIONS simplified abstract
- Micron Technology, Inc. patent applications on August 29th, 2024
- Micron Technology, Inc. patent applications on February 29th, 2024
N
- NANYA TECHNOLOGY CORPORATION patent applications on February 8th, 2024
- Nvidia corporation (20240094291). FLEXIBLE ONE-HOT DECODING LOGIC FOR CLOCK CONTROLS simplified abstract
- Nvidia corporation (20240337690). LOW POWER AND AREA CLOCK MONITORING CIRCUIT USING RING DELAY ARRANGEMENT simplified abstract
- Nvidia corporation (20250012857). FULLY DIGITAL DOMAIN INTEGRATED FREQUENCY MONITOR
- NVIDIA Corporation patent applications on January 23rd, 2025
- NVIDIA Corporation patent applications on January 9th, 2025
- NVIDIA Corporation patent applications on March 21st, 2024
- NVIDIA Corporation patent applications on October 10th, 2024
Q
S
- Samsung electronics co., ltd. (20240159827). METHOD, DEVICE, AND SYSTEM FOR DETECTING FUSE CONFIGURATION FOR TRIMMING CIRCUIT simplified abstract
- Samsung electronics co., ltd. (20240183901). CLOCK MONITORING CIRCUIT simplified abstract
- Samsung electronics co., ltd. (20240201254). JITTER MEASURING CIRCUIT, JITTER ANALYZING APPARATUS INCLUDING THE SAME, AND RELATED METHODS OF MANUFACTURING SEMICONDUCTOR DEVICES simplified abstract
- Samsung electronics co., ltd. (20240210473). SEMICONDUCTOR CHIP AND SEMICONDUCTOR PACKAGE INCLUDING THE SAME simplified abstract
- Samsung electronics co., ltd. (20240302432). BUILT-IN SELF TEST CIRCUIT FOR MEASURING PERFORMANCE OF CLOCK DATA RECOVERY AND SYSTEM-ON-CHIP INCLUDING THE SAME simplified abstract
- Samsung electronics co., ltd. (20240353486). STORAGE SYSTEM AND AN OPERATING METHOD THEREOF simplified abstract
- Samsung electronics co., ltd. (20240402248). MEMORY DEVICE INCLUDING A PLURALITY OF PADS AND METHOD OF DETECTING CRACK OF PADS THEREOF
- Samsung electronics co., ltd. (20240402248). MEMORY DEVICE INCLUDING A PLURALITY OF PADS AND METHOD OF DETECTING CRACK OF PADS THEREOF simplified abstract
- Samsung electronics co., ltd. (20250076377). BUILT-IN SELF-TEST CIRCUIT AND TEMPERATURE MEASUREMENT CIRCUIT INCLUDING THE SAME
- Samsung electronics co., ltd. (20250076381). RECEIVING CIRCUIT IN TEST DEVICE, TEST SYSTEM HAVING THE SAME, AND OPERATING METHOD THEREOF
- Samsung Electronics Co., Ltd. patent applications on December 5th, 2024
- Samsung Electronics Co., Ltd. patent applications on February 6th, 2025
- SAMSUNG ELECTRONICS CO., LTD. patent applications on February 8th, 2024
- Samsung Electronics Co., Ltd. patent applications on June 20th, 2024
- SAMSUNG ELECTRONICS CO., LTD. patent applications on June 20th, 2024
- Samsung Electronics Co., Ltd. patent applications on June 27th, 2024
- SAMSUNG ELECTRONICS CO., LTD. patent applications on June 6th, 2024
- Samsung Electronics Co., Ltd. patent applications on June 6th, 2024
- Samsung Electronics Co., Ltd. patent applications on March 6th, 2025
- Samsung Electronics Co., Ltd. patent applications on May 16th, 2024
- Samsung Electronics Co., Ltd. patent applications on October 24th, 2024
- Samsung Electronics Co., Ltd. patent applications on September 12th, 2024
- Seiko epson corporation (20240110960). SENSOR MODULE simplified abstract
- Seiko epson corporation (20240210469). Oscillator And Electronic Device simplified abstract
- SEIKO EPSON CORPORATION patent applications on April 4th, 2024
- SEIKO EPSON CORPORATION patent applications on June 27th, 2024
- Sk hynix inc. (20240118339). SYSTEM, METHOD FOR CIRCUIT VALIDATION, AND SYSTEM AND METHOD FOR FACILITATING CIRCUIT VALIDATION simplified abstract
- Sk hynix inc. (20240159828). TEST MODE CONTROL CIRCUIT, SEMICONDUCTOR APPARATUS AND SYSTEM, AND METHOD THEREOF simplified abstract
- SK hynix Inc. patent applications on April 11th, 2024
- SK hynix Inc. patent applications on May 16th, 2024
T
- Taiwan semiconductor manufacturing co., ltd. (20240094281). METHOD OF TESTING AN INTEGRATED CIRCUIT AND TESTING SYSTEM simplified abstract
- Taiwan Semiconductor Manufacturing Co., Ltd. patent applications on March 21st, 2024
- Taiwan semiconductor manufacturing company, ltd. (20240295603). DESIGN-FOR-TEST CIRCUITS AND METHODS OF OPERATING THE SAME simplified abstract
- Taiwan Semiconductor Manufacturing Company, Ltd. patent applications on April 25th, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd. patent applications on February 29th, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd. patent applications on September 5th, 2024
- Texas instruments incorporated (20240259023). REDUNDANT ANALOG BUILT-IN SELF TEST simplified abstract
- Texas instruments incorporated (20240280634). Low-Frequency Oscillator Monitoring Circuit simplified abstract
- Texas instruments incorporated (20240319274). 3D STACKED DIE TEST ARCHITECTURE simplified abstract
- Texas instruments incorporated (20240337691). PROGRAMMABLE TEST COMPRESSION ARCHITECTURE INPUT/OUTPUT SHIFT REGISTER simplified abstract
- Texas instruments incorporated (20250004049). METHODS AND APPARATUS TO ESTIMATE ANALOG TO DIGITAL CONVERTER (ADC) ERROR
- Texas Instruments Incorporated patent applications on August 1st, 2024
- Texas Instruments Incorporated patent applications on August 22nd, 2024
- TEXAS INSTRUMENTS INCORPORATED patent applications on January 23rd, 2025
- Texas Instruments Incorporated patent applications on January 2nd, 2025
- Texas Instruments Incorporated patent applications on October 10th, 2024
- TEXAS INSTRUMENTS INCORPORATED patent applications on October 17th, 2024
- Texas Instruments Incorporated patent applications on September 26th, 2024
U
- US Patent Application 17827834. ELECTRONIC CIRCUIT AND METHOD OF ERROR CORRECTION simplified abstract
- US Patent Application 17872479. METHOD AND DEVICE FOR EVALUATING PERFORMANCE OF SEQUENTIAL LOGIC ELEMENT simplified abstract
- US Patent Application 18234003. SCAN TESTING USING SCAN FRAMES WITH EMBEDDED COMMANDS simplified abstract
- US Patent Application 18303401. Built-in Self-Test for Die-to-Die Physical Interfaces simplified abstract
