Texas instruments incorporated (20250085346). MERGED PARAMETRIC SCAN TOPOLOGY

MERGED PARAMETRIC SCAN TOPOLOGY

Organization Name

texas instruments incorporated

Inventor(s)

Abhishek Chaudhary of Nagpur (IN)

Grant Ford of Flower Mound TX (US)

Rubin A. Parekhji of Bangalore (IN)

Edward C. Suder of Garland TX (US)

MERGED PARAMETRIC SCAN TOPOLOGY

This abstract first appeared for US patent application 20250085346 titled 'MERGED PARAMETRIC SCAN TOPOLOGY

Original Abstract Submitted

methods and apparatus for boundary scan. in one example, a circuit includes at least one first input/output (i/o) device, at least one boundary scan element coupled to the at least one first i/o device, and at least one second i/o device coupled to the at least one boundary scan element. the circuit may further include a test controller coupled to the at least one boundary scan element and configured to control the at least one boundary scan element to drive the at least one first i/o device and the at least one second i/o device with a binary test signal.