Samsung sdi co., ltd. (20250147119). METHOD AND SYSTEM FOR DIAGNOSING RETENTION CIRCUIT
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METHOD AND SYSTEM FOR DIAGNOSING RETENTION CIRCUIT
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METHOD AND SYSTEM FOR DIAGNOSING RETENTION CIRCUIT
This abstract first appeared for US patent application 20250147119 titled 'METHOD AND SYSTEM FOR DIAGNOSING RETENTION CIRCUIT
Original Abstract Submitted
the present disclosure provides a retention circuit diagnostic system. the retention circuit diagnostic system includes a first retention circuit configured to output a retention signal for controlling a contactor, and a controller configured to transmit a first signal related to a state control of the contactor, and to transmit a second signal for activating the first retention circuit, and configured to diagnose the first retention circuit based on the retention signal.