Samsung electronics co., ltd. (20250133731). SEMICONDUCTOR DEVICES AND METHODS OF FABRICATING THE SAME
SEMICONDUCTOR DEVICES AND METHODS OF FABRICATING THE SAME
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SEMICONDUCTOR DEVICES AND METHODS OF FABRICATING THE SAME
This abstract first appeared for US patent application 20250133731 titled 'SEMICONDUCTOR DEVICES AND METHODS OF FABRICATING THE SAME
Original Abstract Submitted
a semiconductor device includes a first interlayer insulating layer on a substrate and including an upper surface at a first level, a second interlayer insulating layer on the first interlayer insulating layer, and including a material with less density than that of the first interlayer insulating layer, a first contact in the first interlayer insulating layer and having an upper surface at a second level higher than the first level, a through via in the first interlayer insulating layer and substrate, and having an upper surface at a third level higher than the second level, a first wiring in the second interlayer insulating layer, in contact with the first contact, and having a lower surface at a fourth level lower than the first level, and a second wiring in the second interlayer insulating layer, in contact with the through via, and having a fifth level lower than the fourth level.