Samsung electronics co., ltd. (20250096880). BEAM MEASUREMENT AND REPORTING
BEAM MEASUREMENT AND REPORTING
Organization Name
Inventor(s)
Emad Nader Farag of Flanders NJ US
Eko Onggosanusi of Coppell TX US
BEAM MEASUREMENT AND REPORTING
This abstract first appeared for US patent application 20250096880 titled 'BEAM MEASUREMENT AND REPORTING
Original Abstract Submitted
methods and apparatuses for beam measurement and reporting. a method performed by a user equipment (ue) is provided. the method includes receiving first information related to inclusion in a report of at least one first report quantity associated with a first reference signal (rs) resource and receiving second information related to at least one second rs resource. the method further includes determining, based on the first rs resource, the at least one first report quantity and determining, based on the at least one second rs resource, at least one second report quantity. the method further includes determining, based on (i) the first information and (ii) the at least one second report quantity, the report and transmitting the report.