Samsung electronics co., ltd. (20250076144). PRESSURE GAUGE ZERO POINT CALIBRATION METHOD
PRESSURE GAUGE ZERO POINT CALIBRATION METHOD
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PRESSURE GAUGE ZERO POINT CALIBRATION METHOD
This abstract first appeared for US patent application 20250076144 titled 'PRESSURE GAUGE ZERO POINT CALIBRATION METHOD
Original Abstract Submitted
a pressure gauge zero point calibration method of a pressure gauge having a diaphragm includes performing a first external zero point calibration at a first time, performing a second external zero point calibration at a second time, the second time occurring after the first time, generating a first usage during a first zero point interval, the first zero point interval spanning from the first time to the second time, determining a usage-based offset slope by dividing a zero point offset difference by the first usage, generating a second usage during a second zero point interval, the second zero point interval spanning from the second time to a third time, the third time occurring after the second time, obtaining a third zero point offset based on the usage-based offset slope and the second usage, and applying the third zero point offset to the pressure gauge, the pressure gauge having a diaphragm.