Samsung electronics co., ltd. (20250072096). METHODS OF FABRICATING SEMICONDUCTOR DEVICES
METHODS OF FABRICATING SEMICONDUCTOR DEVICES
Organization Name
Inventor(s)
Gi Woong Shim of Suwon-si (KR)
Seong Heum Choi of Suwon-si (KR)
Hyo Seok Choi of Suwon-si (KR)
Chung Hwan Shin of Suwon-si (KR)
METHODS OF FABRICATING SEMICONDUCTOR DEVICES
This abstract first appeared for US patent application 20250072096 titled 'METHODS OF FABRICATING SEMICONDUCTOR DEVICES
Original Abstract Submitted
a method of fabricating a semiconductor device includes: forming an active pattern on a substrate, forming a source/drain pattern on the active pattern, forming a contact hole on the source/drain pattern, forming a contact barrier layer, which has an upper surface of a first height based on a bottom surface of the contact hole, in the contact hole, forming a passivation layer on the contact barrier layer in the contact hole, forming a mask layer on the passivation layer in the contact hole, removing an upper portion of the contact barrier layer so that an upper surface of the contact barrier layer has a second height lower than the first height, removing the passivation layer and the mask layer, and forming a contact filling layer, which covers the upper surface of the contact barrier layer and fills the contact hole, in the contact hole.
- Samsung electronics co., ltd.
- Gi Woong Shim of Suwon-si (KR)
- Seong Heum Choi of Suwon-si (KR)
- Do Sun Lee of Suwon-si (KR)
- Hyo Seok Choi of Suwon-si (KR)
- Rak Hwan Kim of Suwon-si (KR)
- Chung Hwan Shin of Suwon-si (KR)
- H01L21/8234
- H01L21/308
- H01L21/768
- H01L27/088
- H01L29/06
- H01L29/423
- H01L29/66
- H01L29/775
- H01L29/786
- CPC H01L21/823418